參數(shù)資料
型號(hào): GS8162Z72CGC-250V
廠商: GSI TECHNOLOGY
元件分類: DRAM
英文描述: 18Mb Pipelined and Flow Through Synchronous NBT SRAM
中文描述: 256K X 72 ZBT SRAM, 5.5 ns, PBGA209
封裝: 14 X 22 MM, 1 MM PITCH, ROHS COMPLIANT, FPBGA-209
文件頁(yè)數(shù): 21/27頁(yè)
文件大小: 771K
代理商: GS8162Z72CGC-250V
Select DR
Capture DR
0
Shift DR
Exit1 DR
Pause DR
Exit2 DR
Update DR
1
Select IR
Capture IR
0
Shift IR
Exit1 IR
Pause IR
Exit2 IR
Update IR
1
Test Logic Reset
Run Test Idle
0
1
0
1
1
0
1
1
1
0
0
1
1
0
0
0
0
1
1
0
0
0
0
0
1
1
1
1
GS8162Z72CC-xxxV
Preliminary
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Rev: 1.02a 6/2006
21/27
2004, GSI Technology
JTAG Tap Controller State Diagram
Instruction Descriptions
BYPASS
When the BYPASS instruction is loaded in the Instruction Register the Bypass Register is placed between TDI and TDO. This
occurs when the TAP controller is moved to the Shift-DR state. This allows the board level scan path to be shortened to facilitate
testing of other devices in the scan path.
SAMPLE/PRELOAD
SAMPLE/PRELOAD is a Standard 1149.1 mandatory public instruction. When the SAMPLE / PRELOAD instruction is loaded
in the Instruction Register, moving the TAP controller into the Capture-DR state loads the data in the RAMs input and I/O buffers
into the Boundary Scan Register. Boundary Scan Register locations are not associated with an input or I/O pin, and are loaded
with the default state identified in the Boundary Scan Chain table at the end of this section of the datasheet. Because the RAM
clock is independent from the TAP Clock (TCK) it is possible for the TAP to attempt to capture the I/O ring contents while the
input buffers are in transition (i.e. in a metastable state). Although allowing the TAP to sample metastable inputs will not harm the
device, repeatable results cannot be expected. RAM input signals must be stabilized for long enough to meet the TAPs input data
capture set-up plus hold time (tTS plus tTH). The RAMs clock inputs need not be paused for any other TAP operation except cap-
turing the I/O ring contents into the Boundary Scan Register. Moving the controller to Shift-DR state then places the boundary
scan register between the TDI and TDO pins.
EXTEST
EXTEST is an IEEE 1149.1 mandatory public instruction. It is to be executed whenever the instruction register is loaded with all
logic 0s. The EXTEST command does not block or override the RAM’s input pins; therefore, the RAM’s internal state is still
相關(guān)PDF資料
PDF描述
GS8162Z72C 18Mb Pipelined and Flow Through Synchronous NBT SRAM
GS8162ZV72CC-150I 18Mb Pipelined and Flow Through Synchronous NBT SRAM
GS8162ZV72CC 18Mb Pipelined and Flow Through Synchronous NBT SRAM
GS8162ZV72CC-150 18Mb Pipelined and Flow Through Synchronous NBT SRAM
GS8162ZV72CC-200 18Mb Pipelined and Flow Through Synchronous NBT SRAM
相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
GS8162Z72CGC-300 制造商:GSI Technology 功能描述:SRAM SYNC OCTAL 2.5V/3.3V 18MBIT 256KX72 5NS/2.8NS 209FBGA - Trays
GS8162Z72CGC-300I 制造商:GSI Technology 功能描述:SRAM SYNC OCTAL 2.5V/3.3V 18MBIT 256KX72 5NS/2.8NS 209FBGA - Trays
GS8170DW36AC-300I 制造商:GSI Technology 功能描述:SRAM SYNC QUAD 1.8V 18MBIT 512KX36 1.8NS 209FBGA - Trays
GS8170DW36AC-350 制造商:GSI Technology 功能描述:SRAM SYNC QUAD 1.8V 18MBIT 512KX36 1.7NS 209FBGA - Trays
GS8170DW36AC-350I 制造商:GSI Technology 功能描述:SRAM SYNC QUAD 1.8V 18MBIT 512KX36 1.7NS 209FBGA - Trays