參數(shù)資料
型號： GS8642ZV36GB-167IT
廠商： GSI TECHNOLOGY
元件分類： SRAM
英文描述： 2M X 36 ZBT SRAM, 8 ns, PBGA119
封裝： 22 X 14 MM, 1.27 MM PITCH, LEAD FREE, BGA-119
文件頁數(shù)： 20/32頁
文件大?。?/td> 1452K
代理商： GS8642ZV36GB-167IT
JTAG Port Recommended Operating Conditions and DC Characteristics
Parameter
Symbol
Min.
Max.
Unit Notes
1.8 V Test Port Input High Voltage
VIHJ
0.6 * VDD
VDD +0.3
V
1
1.8 V Test Port Input Low Voltage
VILJ
–0.3
0.3 * VDD
V
1
TMS, TCK and TDI Input Leakage Current
IINHJ
–300
1
uA
2
TMS, TCK and TDI Input Leakage Current
IINLJ
–1
100
uA
3
TDO Output Leakage Current
IOLJ
–1
1
uA
4
Test Port Output High Voltage
VOHJ
1.7
—
V
5, 6
Test Port Output Low Voltage
VOLJ
—
0.4
V
5, 7
Test Port Output CMOS High
VOHJC
VDDQ – 100 mV
—
V
5, 8
Test Port Output CMOS Low
VOLJC
—
100 mV
V
5, 9
Notes:
1. Input Under/overshoot voltage must be –2 V > Vi < VDDn +2 V not to exceed 3.6 V maximum, with a pulse width not to exceed 20% tTKC.
2. VILJ ≤ VIN ≤ VDDn
3. 0 V
≤ VIN ≤ VILJn
4. Output Disable, VOUT = 0 to VDDn
5. The TDO output driver is served by the VDDQ supply.
6. IOHJ = –4 mA
7. IOLJ = + 4 mA
8. IOHJC = –100 uA
9. IOHJC = +100 uA
Product Preview
GS8642ZV18(B)/GS8642ZV36(B)/GS8642ZV72(C)
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Rev: 1.02 5/2005
27/32
2004, GSI Technology
Notes:
1. Include scope and jig capacitance.
2. Test conditions as as shown unless otherwise noted.
JTAG Port AC Test Conditions
Parameter
Conditions
Input high level
VDD – 0.2 V
Input low level
0.2 V
Input slew rate
1 V/ns
Input reference level
VDDQ/2
Output reference level
VDDQ/2
DQ
VDDQ/2
50
30pF*
JTAG Port AC Test Load
* Distributed Test Jig Capacitance
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