參數(shù)資料
型號: H5N2508DL
英文描述: Datasheet|ADE-208-1377|MAR.20.01|58K
中文描述: 技術(shù)資料|腺- 208 - 1377 | MAR.20.01 | 5.8萬
文件頁數(shù): 3/10頁
文件大小: 108K
代理商: H5N2508DL
H5N2503P
Rev.1, Jun. 2002, page 3 of 10
Electrical Characteristics (Ta = 25°C)
Item
Symbol Min
Typ
Max
Unit
Test Conditions
Drain to source breakdown
voltage
V
(BR)DSS
250
V
I
D
= 10 mA, V
GS
= 0
Gate to source leak current
I
GSS
I
DSS
V
GS(off)
R
DS(on)
±0.1
μA
V
GS
= ±30 V, V
DS
= 0
V
DS
= 250 V, V
GS
= 0
V
DS
= 10 V, I
D
= 1 mA
I
D
= 25 A, V
GS
= 10 V
Zero gate voltage drain current
1
μA
Gate to source cutoff voltage
3.0
4.0
V
Static drain to source on state
resistance
0.040
0.055
Note4
Forward transfer admittance
|y
fs
|
Ciss
25
40
S
I
D
= 25 A, V
DS
= 10 V
V
DS
= 25 V
V
GS
= 0
f = 1 MHz
Note4
Input capacitance
5150
pF
Output capacitance
Coss
620
pF
Reverse transfer capacitance
Crss
105
pF
Turn-on delay time
td(on)
58
ns
I
D
= 25 A
V
GS
= 10 V
R
L
= 5
Rg = 10
V
DD
= 200 V
V
GS
= 10 V
I
D
= 50 A
I
F
= 50 A, V
GS
= 0
I
F
= 50 A, V
GS
= 0
Rise time
tr
210
ns
Turn-off delay time
td(off)
220
ns
Fall time
tf
190
ns
Total gate charge
Qg
140
nC
Gate to source charge
Qgs
25
nC
Gate to drain charge
Qgd
60
nC
Body-drain diode forward voltage
V
DF
trr
1.0
1.5
V
Bidy-drain diode reverse recovery
time
210
ns
Body-drain diode reverse recovery
charge
Qrr
1.8
μC
diF/dt = 100 A/μs
Notes: 4. Pulse test
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