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參數(shù)資料
| 型號： | HCS244HMSR |
| 廠商： | HARRIS SEMICONDUCTOR |
| 元件分類： | 通用總線功能 |
| 英文描述： | Radiation Hardened Octal Buffer/Line Driver, Three-State |
| 中文描述： | HC/UH SERIES, DUAL 4-BIT DRIVER, TRUE OUTPUT, UUC16 |
| 文件頁數(shù)： | 6/10頁 |
| 文件大?。?/td> | 173K |
| 代理商： | HCS244HMSR |
317
Specifications HCS244MS
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUPS
METHOD
GROUP A SUBGROUPS
READ AND RECORD
Initial Test (Preburn-In)
100%/5004
1, 7, 9
ICC, IOL/H, IOZL/H
Interim Test
I
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H, IOZL/H
Interim Test
II
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H, IOZL/H
PDA
100%/5004
1, 7, 9, Deltas
Interim Test
III
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H, IOZL/H
PDA
100%/5004
1, 7, 9, Deltas
Final Test
100%/5004
2, 3, 8A, 8B, 10, 11
Group A (Note 1)
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B
Subgroup B-5
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroups 1, 2, 3, 9, 10, 11
Subgroup B-6
Sample/5005
1, 7, 9
Group D
Sample/5005
1, 7, 9
NOTE:
1. Alternate group A testing in accordance with Method 5005 of Mil-Std-883 may be exercised.
TABLE 7. TOTAL DOSE IRRADIATION
CONFORMANCE
GROUPS
METHOD
TEST
READ AND RECORD
PRE RAD
POST RAD
PRE RAD
POST RAD
Group E Subgroup 2
5005
1, 7, 9
Table 4
1, 9
Table 4 (Note 1)
NOTE:
1. Except FN test which will be performed 100% go/no-go.
TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS
OPEN
GROUND
1/2 VCC = 3V
±
0.5V
VCC = 6V
±
0.5V
OSCILLATOR
50kHz
25kHz
STATIC I BURN-IN (Note 1)
3, 5, 7, 9, 12, 14, 16, 18
1, 2, 4, 6, 8, 10, 11,
13, 15, 17, 19
-
20
-
-
STATIC II BURN-IN (Note 1)
3, 5, 7, 9, 12, 14, 16, 18
10
-
1, 2, 4, 6, 8, 11, 13,
15, 17, 19, 20
-
-
DYNAMIC BURN-IN (Note 2)
-
1, 10, 19
3, 5, 7, 9, 12, 14, 16,
18
20
2, 4, 6, 8, 11,
13, 15, 17
-
NOTES:
1. Each pin except VCC and GND will have a resistor of 10K
±
5% for static burn-in
2. Each pin except VCC and GND will have a resistor of 680
±
5% for dynamic burn-in
TABLE 9. IRRADIATION TEST CONNECTIONS
OPEN
GROUND
VCC = 5V
±
0.5V
3, 5, 7, 9, 12, 14, 16, 18
10
1, 2, 4, 6, 8, 11, 13, 15, 17, 19, 20
NOTE: Each pin except VCC and GND will have a resistor of 47K
±
5% for irradiation testing. Group E,
Subgroup 2, sample size is 4 dice/wafer 0 failures.
Spec Number
518763
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| HCS244MS | Octal Buffer/Line Driver, Three-State(抗輻射 CMOS 的八透明緩沖器/線驅(qū)動器（三態(tài)）) |
| HCS244D | Radiation Hardened Octal Buffer/Line Driver, Three-State |
| HCS244DMSR | Radiation Hardened Octal Buffer/Line Driver, Three-State |
| HCS244DTR | Radiation Hardened Octal Buffer/Line Driver, Three-State |
| HCS244K | Radiation Hardened Octal Buffer/Line Driver, Three-State |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| HCS244K | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened Octal Buffer/Line Driver, Three-State |
| HCS244K/SamplE | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened Octal Buffer/Line Driver, Three-State |
| HCS244KMSR | 制造商:Intersil Corporation 功能描述:RAD HARD OCTAL BUFFER/LINE DRIVER,3-ST,FP,200K,CMOS,CLS V - Bulk |
| HCS244KTR | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened Octal Buffer/Line Driver, Three-State |
| HCS244MS | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened Octal Buffer/Line Driver, Three-State |
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