參數(shù)資料
型號(hào)： HCTS283MS
廠商： Intersil Corporation
英文描述： Radiation Hardened 4 Bit Binary Full Adder with Fast Carry
中文描述： 輻射加固4位具有快速卡里二進(jìn)制全加器
文件頁數(shù)： 5/9頁
文件大?。?/td> 296K
代理商： HCTS283MS
5
Specifications HCTS283MS
TABLE 4. DC POST RADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS
PARAMETER
SYMBOL
(NOTES 1)
CONDITIONS
TEMPERATURE
200K RAD
LIMITS
UNITS
MIN
MAX
Quiescent Current
ICC
VCC = 5.5V, VIN = VCC or GND
+25
o
C
-
0.75
mA
Delta ICC
DICC
VCC = 5.5V, VIN = VCC or GND,
1 Input at 2.4V
+25
o
C
-
3.2
mA
Output Current (Sink)
IOL
VCC = 4.5V, VIH = 4.5, VOUT = 0.4V,
VIL = 0V
+25
o
C
4.0
-
mA
Output Current
(Source)
IOH
VCC = 4.5V, VIH = 4.5, VOUT = VCC -0.4V
VIL = 0V
+25
o
C
-4.0
-
mA
Output Voltage Low
VOL
VCC = 4.5V, VIH = 2.25V, VIL = 0.80V,
IOL = 50
μ
A
+25
o
C
-
0.1
V
VCC = 5.5V, VIH = 2.75V, VIL = 0.80V,
IOL = 50
μ
A
+25
o
C
-
0.1
V
Output Voltage High
VOH
VCC = 4.5V, VIH = 2.25V, VIL = 0.80V,
IOL = 50
μ
A
+25
o
C
VCC
-0.1
-
V
VCC = 5.5V, VIH = 2.75V, VIL = 0.80V,
IOL = 50
μ
A
+25
o
C
VCC
-0.1
-
V
Input Leakage Current
IIN
VCC = 5.5V, VIN = VCC or GND
+25
o
C
-
±
5
μ
A
Noise Immunity
Functional Test
FN
VCC = 4.5V, VIH = 2.25V, VIL = 0.80V,
(Note 2)
+25
o
C
-
-
-
Propgation Delay
CIN to S0
TPLH
VCC = 4.5V, VIH = 3.0V, VIL = 0V
+25
o
C
2
27
ns
TPHL
VCC = 4.5V, VIH = 3.0V, VIL = 0V
+25
o
C
2
30
ns
Propagation Delay
CIN to S1
TPLH
VCC = 4.5V, VIH = 3.0V, VIL = 0V
+25
o
C
2
31
ns
TPHL
VCC = 4.5V, VIH = 3.0V, VIL = 0V
+25
o
C
2
35
ns
Propagation Delay
CIN to S2, CIN to COUT
TPLH
VCC = 4.5V, VIH = 3.0V, VIL = 0V
+25
o
C
2
37
ns
TPHL
VCC = 4.5V, VIH = 3.0V, VIL = 0V
+25
o
C
2
40
ns
Propagation Delay
CIN to S3
TPLH
VCC = 4.5V, VIH = 3.0V, VIL = 0V
+25
o
C
2
47
ns
TPHL
VCC = 4.5V, VIH = 3.0V, VIL = 0V
+25
o
C
2
48
ns
Propagation Delay
An, Bn to COUT
TPLH
VCC = 4.5V, VIH = 3.0V, VIL = 0V
+25
o
C
2
67
ns
TPHL
VCC = 4.5V, VIH = 3.0V, VIL = 0V
+25
o
C
2
63
ns
Propagation Delay
An, Bn to Sn
TPLH
VCC = 4.5V, VIH = 3.0V, VIL = 0V
+25
o
C
2
63
ns
TPHL
VCC = 4.5V, VIH = 3.0V, VIL = 0V
+25
o
C
2
73
ns
NOTES:
1. All voltages referenced to device GND.
2. For functional tests VO
≥
4.0V is recognized as a logic “1”, and VO
≤
0.5V is recognized as a logic “0”.
TABLE 5. BURN-IN AND OPERATING LIFE TEST, DELTA PARAMETERS (+25
o
C)
PARAMETER
GROUP B
SUBGROUP
DELTA LIMIT
ICC
5
12
μ
A
IOL/IOH
5
-15% of 0 Hour
Spec Number
518641
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