參數(shù)資料
型號: HCTS299DMSR
廠商: HARRIS SEMICONDUCTOR
元件分類: 通用總線功能
英文描述: Radiation Hardened 8-Bit Universal Shift Register; Three-State
中文描述: HCT SERIES, 8-BIT BIDIRECTIONAL PARALLEL IN PARALLEL OUT SHIFT REGISTER, TRUE OUTPUT, CDIP20
文件頁數(shù): 8/13頁
文件大小: 118K
代理商: HCTS299DMSR
631
HCTS299MS
TABLE 7. TOTAL DOSE IRRADIATION
CONFORMANCE
GROUPS
METHOD
TEST
READ AND RECORD
PRE RAD
POST RAD
PRE RAD
POST RAD
Group E Subgroup 2
5005
1, 7, 9
Table 4
1, 9
Table 4 (Note 1)
NOTE: 1. Except FN test which will be performed 100% Go/No-Go.
TABLE 8. STATIC BURN-IN AND DYNAMIC
OPEN
GROUND
1/2 VCC = 3V
±
0.5V
VCC = 6V
±
0.5V
OSCILLATOR
50kHz
25kHz
STATIC BURN-IN I TEST CONNECTIONS (Note 1)
8, 17
1 - 7, 9 - 16, 18, 19
-
20
-
-
STATIC BURN-IN II TEST CONNECTIONS (Note 1)
8, 17
10
-
1 - 7, 9, 11 - 16, 18 - 20
-
-
DYNAMIC BURN-IN TEST CONNECTIONS (Note 2)
-
2, 3, 10, 18, 19
4 - 8, 13 - 17
1, 9, 20
12
11
NOTES:
1. Each pin except VCC and GND will have a resistor of 10k
±
5% for static burn-in
2. Each pin except VCC and GND will have a resistor of 680
±
5% for dynamic burn-in
TABLE 9. IRRADIATION TEST CONNECTIONS
OPEN
GROUND
VCC = 5V
±
0.5V
8, 17
10
1 - 7, 9, 11 - 16, 18 - 20
NOTE: Each pin except VCC and GND will have a resistor of 47K
±
5% for irradiation testing.
Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures.
Spec Number
518640
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