- 您現(xiàn)在的位置：買賣IC網(wǎng) > PDF目錄371787 > HCTS299K (Intersil Corporation) Radiation Hardened 8-Bit Universal Shift Register; Three-State PDF資料下載
參數(shù)資料
| 型號(hào)： | HCTS299K |
| 廠商： | Intersil Corporation |
| 英文描述： | Radiation Hardened 8-Bit Universal Shift Register; Three-State |
| 中文描述： | 輻射加固8位通用移位寄存器，三態(tài) |
| 文件頁(yè)數(shù)： | 7/13頁(yè) |
| 文件大?。?/td> | 118K |
| 代理商： | HCTS299K |
第1頁(yè)第2頁(yè)第3頁(yè)第4頁(yè)第5頁(yè)第6頁(yè)當(dāng)前第7頁(yè)第8頁(yè)第9頁(yè)第10頁(yè)第11頁(yè)第12頁(yè)第13頁(yè)
630
Specifications HCTS299MS
MR to Output
TPHL
VCC = 4.5V
+25
o
C
2
36
ns
OEn to Output
TPZH
VCC = 4.5V
+25
o
C
2
25
ns
TPHZ
2
27
ns
TPZL
VCC = 4.5V
+25
o
C
2
34
ns
TPLZ
2
34
ns
NOTES:
1. All voltages referenced to device GND.
2. AC measurements assume RL = 500
, CL = 50pF, Input TR =TF = 3ns, VIL = GND, VIH = 3V.
3. For functional tests VO
≥
4.0V is recognized as a logic “1”, and VO
≤
0.5V is recognized as a logic “0”.
TABLE 5. BURN-IN AND OPERATING LIFE TEST, DELTA PARAMETERS (+25
o
C)
PARAMETER
GROUP B
SUBGROUP
DELTA LIMIT
ICC
5
12
μ
A
IOL/IOH
5
-15% of 0 Hour
IOZL/IOZH
5
±
200nA
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUPS
METHOD
GROUP A SUBGROUPS
READ AND RECORD
Initial Test (Preburn-In)
100%/5004
1, 7, 9
ICC, IOL/H, IOZL/H
Interim Test
I
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H, IOZL/H
Interim Test
II
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H, IOZL/H
PDA
100%/5004
1, 7, 9, Deltas
Interim Test
III
(Postburn-In)
100%/5004
1, 7, 9
PDA
100%/5004
1, 7, 9, Deltas
Final Test
100%/5004
2, 3, 8A, 8B, 10, 11
Group A (Note 1)
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B
Subgroup B-5
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroups 1, 2, 3, 9, 10, 11
Subgroup B-6
Sample/5005
1, 7, 9
Group D
Sample/5005
1, 7, 9
NOTE: 1. Alternate Group A Inspection in accordance with Method 5005 of MIL-STD-883 may be exercised.
TABLE 4. DC POST RADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS
PARAMETER
SYMBOL
(NOTES 1, 2)
CONDITIONS
TEMPERATURE
200K RAD
LIMITS
UNITS
MIN
MAX
Spec Number
518640
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| HCTS299KMSR | Radiation Hardened 8-Bit Universal Shift Register; Three-State |
| HCTS32HMSR | Radiation Hardened Quad 2-Input OR Gate |
| HCTS32D | Radiation Hardened Quad 2-Input OR Gate |
| HCTS32DMSR | Radiation Hardened Quad 2-Input OR Gate |
| HCTS32K | Octal D-type Edge-Triggered Flip-Flops With 3-State Outputs 20-LCCC -55 to 125 |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| HCTS299KMSR | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened 8-Bit Universal Shift Register; Three-State |
| HCTS299MS | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened 8-Bit Universal Shift Register; Three-State |
| HCTS299MS_02 | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened 8-Bit Universal Shift Register; Three-State |
| HCTS30D | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened 8-Input NAND Gate |
| HCTS30DMSR | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened 8-Input NAND Gate |
發(fā)布緊急采購(gòu)，3分鐘左右您將得到回復(fù)。