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參數(shù)資料
| 型號(hào)： | HDSP-x101 |
| 英文描述： | Double Hetero junction AlGaAs Red Low Current Seven Segment Displays(雙異質(zhì)結(jié)鋁砷化鎵紅色低電流七段段碼顯示器) |
| 中文描述： | 雙異質(zhì)結(jié)AlGaAs的紅色小電流七段顯示器（雙異質(zhì)結(jié)鋁砷化鎵紅色低電流七段段碼顯示器） |
| 文件頁(yè)數(shù)： | 1/2頁(yè) |
| 文件大小： | 32K |
| 代理商： | HDSP-X101 |
Double Heterojunction AlGaAs Red
Low Current
Seven Segment Displays
Reliability Data
Description
The following cumulative test
results have been obtained from
testing performed at Agilent
Technologies in accordance with
the latest revision of MIL- STD-
883.
HDSP-x100 Series
HDSP-x101 Series
Agilent Technologies tests parts at
the absolute maximum rated
conditions recommended for the
device. The actual performance
you obtain from Agilent parts
depends on the electrical and
environmental characteristics of
your application but will probably
be better than the performance
outlined in Table 1.
Table 1. Life Tests Demonstrated Performance
Stress Test
Conditions
Total
Units
Tested
Total
F ailed
[1]
F ailure Rate
( % /1K Hours)
[2]
Test Name
Device Hrs.
High Temperature
Operating Life
I
F
= 15 mA DC
T
A
= 55
°
C
435,000
435
0
≤
0.230
Point Typical
Performance
Failure Rate Prediction
The failure rate given is at elevated
operating conditions. The failure
rate will depend on the junction
temperature of the device. Assum-
ing a package thermal resistance
of 430
°
C per watt the calculated
temperature rise during testing
was approximately 14
°
C above the
ambient temperature. The esti-
mated life at different tempera-
tures is calculated and listed in the
following table. Estimations are
done using the Arrhenius model
with the activation energy of
0.43 eV in reference to the
MIL-HDBK-217 for hybrid
products.
Example of Failure Rate
Calculation
Assume a device operating 8 hours/
day, 5 days/week. The utilization fac-
tor, given 168 hours/week is:
(8 hours/day) x (5 days/week) /
(168 hours/week) = 0.25
Notes:
1. For purposes of this data sheet, a failure is any device that (a) has V
F
greater than 0.5 V over the maximum data sheet specification
or (b) has V
R
smaller than 3.0 V at 100
μ
A or (c) degrades in light output more than 75%.
2. Assuming one failure for calculation.
The point failure rate per year (8760
hours) at 55
°
C ambient temperature
is:
(0.230% / 1K hours) x 0.25 x
(8760 hours/year) = 0.500% per year.
Similarly, 90% confidence level failure
rate per year at 55
°
C ambient
temperature is:
(0.529% / 1K hours) x 0.25 x
(8760 hours/year) = 1.15% per year.
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