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參數(shù)資料
| 型號(hào)： | HI5760/6IBZ |
| 廠商： | Intersil |
| 文件頁(yè)數(shù)： | 6/18頁(yè) |
| 文件大?。?/td> | 0K |
| 描述： | CONV D/A 10BIT 60MSPS 28-SOIC |
| 標(biāo)準(zhǔn)包裝： | 260 |
| 設(shè)置時(shí)間： | 35ns |
| 位數(shù)： | 10 |
| 數(shù)據(jù)接口： | 并聯(lián) |
| 轉(zhuǎn)換器數(shù)目： | 1 |
| 電壓電源： | 模擬和數(shù)字 |
| 功率耗散（最大）： | 165mW |
| 工作溫度： | -40°C ~ 85°C |
| 安裝類型： | 表面貼裝 |
| 封裝/外殼： | 28-SOIC（0.295"，7.50mm 寬） |
| 供應(yīng)商設(shè)備封裝： | 28-SOIC W |
| 包裝： | 管件 |
| 輸出數(shù)目和類型： | 2 電流，單極 |
| 采樣率（每秒）： | 125M |
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14
Definition of Specifications
Integral Linearity Error, INL, is the measure of the worst
case point that deviates from a best fit straight line of data
values along the transfer curve.
Differential Linearity Error, DNL, is the measure of the
step size output deviation from code to code. Ideally the step
size should be 1 LSB. A DNL specification of 1 LSB or less
guarantees monotonicity.
Output Settling Time, is the time required for the output
voltage to settle to within a specified error band measured
from the beginning of the output transition. In the case of the
HI5760, the measurement was done by switching from code
0 to 256, or quarter scale. Termination impedance was 25
due to the parallel resistance of the output 50 and the
oscilloscope’s 50 input. This also aids the ability to resolve
the specified error band without overdriving the oscilloscope.
Singlet Glitch Area, is the switching transient appearing on
the output during a code transition. It is measured as the
area under the overshoot portion of the curve and is
expressed as a Volt-Time specification.
Full Scale Gain Error, is the error from an ideal ratio of 32
between the output current and the full scale adjust current
(through RSET).
Full Scale Gain Drift, is measured by setting the data inputs
to all ones and measuring the output voltage through a
known resistance as the temperature is varied from TMIN to
TMAX. It is defined as the maximum deviation from the value
measured at room temperature to the value measured at
either TMIN or TMAX. The units are ppm of FSR (full scale
range) per degree C.
Total Harmonic Distortion, THD, is the ratio of the DAC
output fundamental to the RMS sum of the first five
harmonics.
Spurious Free Dynamic Range, SFDR, is the amplitude
difference from the fundamental to the largest harmonically or
non-harmonically related spur within the specified window.
Output Voltage Compliance Range, is the voltage limit
imposed on the output. The output impedance load should
be chosen such that the voltage developed does not violate
the compliance range.
Offset Error, is measured by setting the data inputs to all
zeros and measuring the output voltage through a known
resistance. Offset error is defined as the maximum deviation
of the output current from a value of 0mA.
Offset Drift, is measured by setting the data inputs to all
zeros and measuring the output voltage through a known
resistance as the temperature is varied from TMIN to TMAX.
It is defined as the maximum deviation from the value
measured at room temperature to the value measured at
either TMIN or TMAX. The units are ppm of FSR (full scale
range) per degree C.
Power Supply Rejection, is measured using a single power
supply. Its nominal +5V is varied ±10% and the change in
the DAC full scale output is noted.
Reference Input Multiplying Bandwidth, is defined as the
3dB bandwidth of the voltage reference input. It is measured
by using a sinusoidal waveform as the external reference
with the digital inputs set to all 1s. The frequency is
increased until the amplitude of the output waveform is
0.707 of its original value.
Internal Reference Voltage Drift, is defined as the
maximum deviation from the value measured at room
temperature to the value measured at either Tmin or Tmax.
The units are ppm per degree C.
Detailed Description
The HI5760 is a 10-bit, current out, CMOS, digital to analog
converter. Its maximum update rate is 125MSPS and can be
powered by either single or dual power supplies in the
recommended range of +3V to +5V. It consumes less than
165mW of power when using a +5V supply with the data
switching at 100MSPS. The architecture is based on a
segmented current source arrangement that reduces glitch
by reducing the amount of current switching at any one time.
The five MSBs are represented by 31 major current sources
of equivalent current. The five LSBs are comprised of binary
weighted current sources. Consider an input waveform to
the converter which is ramped through all the codes from 0
to 1023. The five LSB current sources would begin to count
up. When they reached the all high state (decimal value of
31) and needed to count to the next code, they would all turn
off and the first major current source would turn on. To
continue counting upward, the 5 LSBs would count up
another 31 codes, and then the next major current source
would turn on and the five LSBs would all turn off. The
process of the single, equivalent, major current source
turning on and the five LSBs turning off each time the
converter reaches another 31 codes greatly reduces the
glitch at any one switching point. In previous architectures
that contained all binary weighted current sources or a
binary weighted resistor ladder, the converter might have a
substantially larger amount of current turning on and off at
certain, worst-case transition points such as mid-scale and
quarter scale transitions. By greatly reducing the amount of
current switching at certain ‘major’ transitions, the overall
glitch of the converter is dramatically reduced, improving
settling times and transient problems.
HI5760
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| HI5760BIB | 功能描述:IC DAC 10-BIT 125MSPS 28-SOIC RoHS:否 類別:集成電路 (IC) >> 數(shù)據(jù)采集 - 數(shù)模轉(zhuǎn)換器 系列:- 標(biāo)準(zhǔn)包裝:2,400 系列:- 設(shè)置時(shí)間:- 位數(shù):18 數(shù)據(jù)接口:串行 轉(zhuǎn)換器數(shù)目:3 電壓電源:模擬和數(shù)字 功率耗散（最大）:- 工作溫度:-40°C ~ 85°C 安裝類型:表面貼裝 封裝/外殼:36-TFBGA 供應(yīng)商設(shè)備封裝:36-TFBGA 包裝:帶卷 (TR) 輸出數(shù)目和類型:* 采樣率（每秒）:* |
| HI5760BIB-T | 功能描述:CONV D/A 10-BIT 125MSPS 28-SOIC RoHS:否 類別:集成電路 (IC) >> 數(shù)據(jù)采集 - 數(shù)模轉(zhuǎn)換器 系列:- 標(biāo)準(zhǔn)包裝:2,400 系列:- 設(shè)置時(shí)間:- 位數(shù):18 數(shù)據(jù)接口:串行 轉(zhuǎn)換器數(shù)目:3 電壓電源:模擬和數(shù)字 功率耗散（最大）:- 工作溫度:-40°C ~ 85°C 安裝類型:表面貼裝 封裝/外殼:36-TFBGA 供應(yīng)商設(shè)備封裝:36-TFBGA 包裝:帶卷 (TR) 輸出數(shù)目和類型:* 采樣率（每秒）:* |
| HI5760BIBZ | 功能描述:數(shù)模轉(zhuǎn)換器- DAC D/A 10-BIT 125MSPS 28PIN INDUST TEMP RoHS:否 制造商:Texas Instruments 轉(zhuǎn)換器數(shù)量:1 DAC 輸出端數(shù)量:1 轉(zhuǎn)換速率:2 MSPs 分辨率:16 bit 接口類型:QSPI, SPI, Serial (3-Wire, Microwire) 穩(wěn)定時(shí)間:1 us 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:SOIC-14 封裝:Tube |
| HI5760BIBZ-T | 功能描述:數(shù)模轉(zhuǎn)換器- DAC D/A 10-BIT 125MSPS 28PIN INDUST TEMP RoHS:否 制造商:Texas Instruments 轉(zhuǎn)換器數(shù)量:1 DAC 輸出端數(shù)量:1 轉(zhuǎn)換速率:2 MSPs 分辨率:16 bit 接口類型:QSPI, SPI, Serial (3-Wire, Microwire) 穩(wěn)定時(shí)間:1 us 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:SOIC-14 封裝:Tube |
| HI5760EVAL1 | 功能描述:數(shù)據(jù)轉(zhuǎn)換 IC 開(kāi)發(fā)工具 HI5760 EVAL PL ATFORM PKG RoHS:否 制造商:Texas Instruments 產(chǎn)品:Demonstration Kits 類型:ADC 工具用于評(píng)估:ADS130E08 接口類型:SPI 工作電源電壓:- 6 V to + 6 V |
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