3
Absolute Maximum Ratings
Thermal Information
Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +8.0V
Input, Output or I/O Voltage . . . . . . . . . . . . GND -0.5V to VCC +0.5V
ESD Classification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Class 1
Operating Conditions
Operating Voltage Range . . . . . . . . . . . . . . . . . . . . . +4.5V to +5.5V
Operating Temperature Range . . . . . . . . . . . . . . . . . -40oC to +85oC
Thermal Resistance (Typical)
θ
JA (
oC/W)
θ
JC (
oC/W)
CERDIP Package . . . . . . . . . . . . . . . .
70
16
Maximum Storage Temperature Range . . . . . . . . . -65oC to +150oC
Maximum Junction Temperature . . . . . . . . . . . . . . . . . . . . . . +175oC
Maximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . +300oC
Die Characteristics
Gate Count . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 265 Gates
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of
the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
DC Electrical Specifications V
CC = 5.0V ± 10%; TA = -40
oC to +85oC
SYMBOL
PARAMETER
MIN
MAX
UNITS
TEST CONDITIONS
VIH
Logical One
2.0
-
V
C82C86H, I82C86H
Input Voltage
2.2
V
M82C86H (Note 1)
VIL
Logical Zero Input Voltage
-
0.8
V
VOH
Logical One Output Voltage
B Outputs
3.0
V
IOH = -8mA
A Outputs
3.0
V
IOH = -4mA
A or B Outputs
VCC -0.4
V
IOH = -100A
VOL
Logical Zero Output Voltage
B Outputs
0.45
V
IOL = 20mA
A Outputs
0.45
V
IOL = 12mA
II
Input Leakage Current
-10.0
10.0
AV
IN = GND or VCC DIP Pins 9, 11
IO
Output Leakage Current
-10.0
10.0
A
VO = GND or VCC, OE ≥ VCC -0.5V
DIP Pins 1 - 8, 12 - 19
ICCSB
Standby Power Supply
Current
-10
AV
IN = VCC or GND, VCC = 5.5V, Outputs Open
ICCOP
Operating Power Supply
Current
-1
mA/MHz
TA = +25
oC, Typical (See Note 2)
NOTES:
1. VIH is measured by applying a pulse of magnitude = VIH(MIN) to one data input at a time and checking the corresponding device output for
a valid logical “1” during valid input high time. Control pins (T, OE) are tested separately with all device data input pins at VCC -0.4
2. Typical ICCOP = 1mA/MHz of read/ cycle time. (Example: 1.0
s read/write cycle time = 1mA).
Capacitance
TA = +25
oC
SYMBOL
PARAMETER
TYPICAL
UNITS
TEST CONDITIONS
CIN
Input Capacitance
B Inputs
18
pF
Freq = 1MHz, all measurements are
referenced to device GND
A Inputs
14
pF
82C86H