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參數(shù)資料
| 型號： | IDT74FCT388915T150PY |
| 廠商： | INTEGRATED DEVICE TECHNOLOGY INC |
| 元件分類： | 時鐘及定時 |
| 英文描述： | 3.3V LOW SKEW PLL-BASED CMOS CLOCK DRIVER WITH (3-STATE) |
| 中文描述： | FCT SERIES, PLL BASED CLOCK DRIVER, 7 TRUE OUTPUT(S), 1 INVERTED OUTPUT(S), PDSO28 |
| 封裝： | SSOP-28 |
| 文件頁數(shù)： | 9/11頁 |
| 文件大?。?/td> | 145K |
| 代理商： | IDT74FCT388915T150PY |
IDT54/74FCT388915T 70/100/133/150
3.3V LOW SKEW PLL-BASED CLOCK DRIVER
MILITARY AND COMMERCIAL TEMPERATURE RANGES
9.8
9
CMMU
CMMU
CPU
CMMU
CMMU
CMMU
CMMU
CMMU
CPU
CMMU
CMMU
CMMU
PLL
2f
PLL
2f
CPU
CARD
CPU
CARD
CLOCK
@f
SYSTEM
CLOCK
SOURCE
FCT388915T
FCT388915T
DISTRIBUTE
CLOCK @f
CLOCK @2f
at point of use
MEMORY
CONTROL
PLL
2f
MEMORY
CARDS
CLOCK @2f
at point of use
FCT388915T
Figure 4. Multiprocessing Application Using the FCT388915T for Frequency Multiplication
and Low Board-to-Board skew
FCT388915T System Level Testing Functionality
When the PLL_EN pin is LOW, the PLL is bypassed and the
FCT388915T is in low frequency "test mode". In test mode
(with FREQ_SEL HIGH), the 2Q output is inverted from the
selected SYNC input, and the Q outputs are divide-by-2
(negative edge triggered) of the SYNC input, and the Q/2
output is divide-by-4 (negative edge triggered). With
FREQ_SEL LOW the 2Q output is divide-by-2 of the SYNC,
the Q outputs divide-by-4, and the Q/2 output divide-by-8.
These relationships can be seen in the block diagram. A
recommended test configuration would be to use SYNC0 or
SYNC1 as the test clock input, and tie PLL_EN and REF_SEL
together and connect them to the test select logic.
This functionality is needed since most board-level testers
run at 1 MHz or below, and theFCT 388915T cannot lock onto
that low of an input frequency. In the test mode described
above, any test frequency test can be used.
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相關PDF資料 |
PDF描述 |
|---|---|
| IDT74FCT388915T150PYB | 3.3V LOW SKEW PLL-BASED CMOS CLOCK DRIVER WITH (3-STATE) |
| IDT54FCT388915T133PYB | 3.3V LOW SKEW PLL-BASED CMOS CLOCK DRIVER WITH (3-STATE) |
| IDT74FCT388915T133PYB | 3.3V LOW SKEW PLL-BASED CMOS CLOCK DRIVER WITH (3-STATE) |
| IDT74FCT388915T70 | 3.3V LOW SKEW PLL-BASED CMOS CLOCK DRIVER WITH (3-STATE) |
| IDT54FCT388915T70 | 3.3V LOW SKEW PLL-BASED CMOS CLOCK DRIVER WITH (3-STATE) |
相關代理商/技術參數(shù) |
參數(shù)描述 |
|---|---|
| IDT74FCT388915T70J | 制造商:Integrated Device Technology Inc 功能描述:EIGHT DISTRIBUTED-OUTPUT CLOCK DRIVER, 28 Pin, Plastic, PLCC |
| IDT74FCT388915T70PY | 制造商:Integrated Device Technology 功能描述:74FCT 70MHz 10 to 70MHz Tray |
| IDT74FCT388915TBJG | 功能描述:IC PLL CLK GENERATOR 3ST 28-PLCC RoHS:是 類別:集成電路 (IC) >> 時鐘/計時 - 時鐘發(fā)生器，PLL，頻率合成器 系列:74FCT 標準包裝:1,000 系列:- 類型:時鐘/頻率合成器，扇出分配 PLL:- 輸入:- 輸出:- 電路數(shù):- 比率 - 輸入:輸出:- 差分 - 輸入:輸出:- 頻率 - 最大:- 除法器/乘法器:- 電源電壓:- 工作溫度:- 安裝類型:表面貼裝 封裝/外殼:56-VFQFN 裸露焊盤 供應商設備封裝:56-VFQFP-EP（8x8） 包裝:帶卷 (TR) 其它名稱:844S012AKI-01LFT |
| IDT74FCT388915TBJG8 | 功能描述:IC PLL CLK GENERATOR 3ST 28-PLCC RoHS:是 類別:集成電路 (IC) >> 時鐘/計時 - 時鐘發(fā)生器，PLL，頻率合成器 系列:74FCT 標準包裝:1,000 系列:- 類型:時鐘/頻率合成器，扇出分配 PLL:- 輸入:- 輸出:- 電路數(shù):- 比率 - 輸入:輸出:- 差分 - 輸入:輸出:- 頻率 - 最大:- 除法器/乘法器:- 電源電壓:- 工作溫度:- 安裝類型:表面貼裝 封裝/外殼:56-VFQFN 裸露焊盤 供應商設備封裝:56-VFQFP-EP（8x8） 包裝:帶卷 (TR) 其它名稱:844S012AKI-01LFT |
| IDT74FCT388915TCJG | 功能描述:IC PLL CLK GENERATOR 3ST 28-PLCC RoHS:是 類別:集成電路 (IC) >> 時鐘/計時 - 時鐘發(fā)生器，PLL，頻率合成器 系列:74FCT 標準包裝:1,000 系列:- 類型:時鐘/頻率合成器，扇出分配 PLL:- 輸入:- 輸出:- 電路數(shù):- 比率 - 輸入:輸出:- 差分 - 輸入:輸出:- 頻率 - 最大:- 除法器/乘法器:- 電源電壓:- 工作溫度:- 安裝類型:表面貼裝 封裝/外殼:56-VFQFN 裸露焊盤 供應商設備封裝:56-VFQFP-EP（8x8） 包裝:帶卷 (TR) 其它名稱:844S012AKI-01LFT |
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