參數(shù)資料
型號(hào): IRG4BH40KD
廠商: International Rectifier
英文描述: Fit Rate / Equivalent Device Hours
中文描述: FIT率/等效器件小時(shí)
文件頁(yè)數(shù): 29/35頁(yè)
文件大?。?/td> 112K
代理商: IRG4BH40KD
ACCELERATEDMOISTURE RESISTANCE (A/C)Unbiased
Conditions
Temperature:
Pressure:
Bias:
Duration:
Test points:
121°C
15Ibs psig
None
96 Hours nominal
96 Hours
Purpose
Failure Modes
Sensitive Parameters
V
(BR)CES,
V
CE(on)
Accelerated Moisture Resistance test is performed to evaluate the moisture resistance
of non-hermetic packages. Severe conditions of pressure, humidity and temperature
are applied that accelerate the penetration of moisture through the interface of the
encapsulant and the conductors that pass through it.
There are two failure modes which have been observed. The first mode, degradation
of the breakdown characteristics of the devices, can occur.
The second failure mode that has been observed is due to cathodic corrosion of
aluminum emitter bonding pad. Water will ingress to the top of the die. It is possible
for contaminants to work their way into the active area of the device while under
pressure in the presence of water. For that reason, the devices and test board are
cleaned prior to use. Then, throughout the course of the testing, the parts and the test
boards are never brought into contact with human contaminant.
IGBT / CoPack
Quarterly Reliability Report
Page 29 of 35
相關(guān)PDF資料
PDF描述
IRG4BH40MD Fit Rate / Equivalent Device Hours
IRG4BH40SD Fit Rate / Equivalent Device Hours
IRG4BH40UD Fit Rate / Equivalent Device Hours
IRG4PC40MD Fit Rate / Equivalent Device Hours
IRG4PC40SD Fit Rate / Equivalent Device Hours
相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
IRG4BH40MD 制造商:IRF 制造商全稱:International Rectifier 功能描述:Fit Rate / Equivalent Device Hours
IRG4BH40SD 制造商:IRF 制造商全稱:International Rectifier 功能描述:Fit Rate / Equivalent Device Hours
IRG4BH40UD 制造商:IRF 制造商全稱:International Rectifier 功能描述:Fit Rate / Equivalent Device Hours
IRG4C30W-S 制造商:未知廠家 制造商全稱:未知廠家 功能描述:
IRG4CC10KB 制造商:IRF 制造商全稱:International Rectifier 功能描述:IRG4CC10KB IGBT Die in Wafer Form