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參數(shù)資料
| 型號： | IS450 |
| 廠商： | Sharp Corporation |
| 英文描述： | OPIC LIGHT DETECTOR WITH BULLT-IN SIGNAL PROCESSING CIRCULT FOR LIGHT MODULATION SYSTEM |
| 中文描述： | 海外私人投資公司與BULLT光檢測器的信號的光調制系統(tǒng)處理CIRCULT |
| 文件頁數(shù)： | 5/14頁 |
| 文件大?。?/td> | 490K |
| 代理商： | IS450 |
IS61SP12832
Integrated Circuit Solution Inc.
5
SSR011-0B
INTERLEAVED BURST ADDRESS TABLE (MODE = V
CCQ
or No Connect)
External Address
A1 A0
1st Burst Address
A1 A0
2nd Burst Address
A1 A0
3rd Burst Address
A1 A0
00
01
10
11
01
00
11
10
10
11
00
01
11
10
01
00
LINEAR BURST ADDRESS TABLE (MODE = GND
Q
)
0,0
1,0
0,1
A1
’
, A0
’
= 1,1
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol
Parameter
Value
Unit
T
BIAS
Temperature Under Bias
–40 to +85
°C
T
STG
Storage Temperature
–55 to +150
°C
P
D
Power Dissipation
1.6
W
I
OUT
Output Current (per I/O)
100
mA
V
IN
, V
OUT
Voltage Relative to GND for I/O Pins
–0.5 to V
CCQ
+ 0.3
V
V
IN
Voltage Relative to GND for
–0.5 to V
CC
+ 0.5
V
for Address and Control Inputs
V
CC
Voltage on Vcc Supply Relatiive to GND
–0.5 to 4.6
V
Notes:
1. Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation of the
device at these or any other conditions above those indicated in the operational sections of
this specification is not implied. Exposure to absolute maximum rating conditions for
extended periods may affect reliability.
2. This device contains circuity to protect the inputs against damage due to high static voltages
or electric fields; however, precautions may be taken to avoid application of any voltage
higher than maximum rated voltages to this high-impedance circuit.
3. This device contains circuitry that will ensure the output devices are in High-Z at power up.
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