VIL A1, A0, SDA, and SCL input buffer LOW voltage -0.3 " />
參數(shù)資料
型號(hào)： ISL22313TFU10Z
廠商： Intersil
文件頁數(shù)： 12/15頁
文件大?。?/td> 0K
描述： IC POT DGTL 256TP LN LP 10-MSOP
標(biāo)準(zhǔn)包裝： 1,000
系列： XDCP™
接片： 256
電阻（歐姆）： 100k
電路數(shù)： 1
溫度系數(shù)： 標(biāo)準(zhǔn)值 50 ppm/°C
存儲(chǔ)器類型： 非易失
接口： I²C（設(shè)備位址）
電源電壓： 2.25 V ~ 5.5 V
工作溫度： -40°C ~ 125°C
安裝類型： 表面貼裝
封裝/外殼： 10-TFSOP，10-MSOP（0.118"，3.00mm 寬）
供應(yīng)商設(shè)備封裝： 10-MSOP
包裝： 管件
6
FN6421.0
July 17, 2007
SERIAL INTERFACE SPECS
VIL
A1, A0, SDA, and SCL input buffer
LOW voltage
-0.3
0.3*VCC
V
VIH
A1, A0, SDA, and SCL input buffer
HIGH voltage
0.7*VCC
VCC +0.
3
V
Hysteresis
(Note 16)
SDA and SCL input buffer hysteresis
0.05*VCC
V
VOL
(Note 16)
SDA output buffer LOW voltage,
sinking 4mA
00.4
V
Cpin
(Note 16)
A1, A0, SDA, and SCL pin
capacitance
10
pF
fSCL
SCL frequency
400
kHz
tsp
Pulse width suppression time at SDA
and SCL inputs
Any pulse narrower than the max spec is
suppressed
50
ns
tAA
(Note 16)
SCL falling edge to SDA output data
valid
SCL falling edge crossing 30% of VCC, until
SDA exits the 30% to 70% of VCC window
900
ns
tBUF
(Note 16)
Time the bus must be free before the
start of a new transmission
SDA crossing 70% of VCC during a STOP
condition, to SDA crossing 70% of VCC
during the following START condition
1300
ns
tLOW
Clock LOW time
Measured at the 30% of VCC crossing
1300
ns
tHIGH
Clock HIGH time
Measured at the 70% of VCC crossing
600
ns
tSU:STA
START condition setup time
SCL rising edge to SDA falling edge; both
crossing 70% of VCC
600
ns
tHD:STA
START condition hold time
From SDA falling edge crossing 30% of VCC
to SCL falling edge crossing 70% of VCC
600
ns
tSU:DAT
Input data setup time
From SDA exiting the 30% to 70% of VCC
window, to SCL rising edge crossing 30% of
VCC
100
ns
tHD:DAT
Input data hold time
From SCL rising edge crossing 70% of VCC
to SDA entering the 30% to 70% of VCC
window
0ns
tSU:STO
STOP condition setup time
From SCL rising edge crossing 70% of VCC,
to SDA rising edge crossing 30% of VCC
600
ns
tHD:STO
STOP condition hold time for read, or
volatile only write
From SDA rising edge to SCL falling edge;
both crossing 70% of VCC
1300
ns
tDH
(Note 16)
Output data hold time
From SCL falling edge crossing 30% of VCC,
until SDA enters the 30% to 70% of VCC
window
0ns
tR
(Note 16)
SDA and SCL rise time
From 30% to 70% of VCC
20 +
0.1 * Cb
250
ns
tF
(Note 16)
SDA and SCL fall time
From 70% to 30% of VCC
20 +
0.1 * Cb
250
ns
Cb
(Note 16)
Capacitive loading of SDA or SCL
Total on-chip and off-chip
10
400
pF
Rpu
(Note 16)
SDA and SCL bus pull-up resistor
off-chip
Maximum is determined by tR and tF
For Cb = 400pF, max is about 2k
Ω~2.5kΩ
For Cb = 40pF, max is about 15k
Ω~20kΩ
1k
Ω
Operating Specifications Over the recommended operating conditions unless otherwise specified. Limits are established by
characterization. (Continued)
SYMBOL
PARAMETER
TEST CONDITIONS
MIN
(Note 18)
TYP
(Note 4)
MAX
(Note 18)
UNIT
ISL22313
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