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參數(shù)資料
| 型號： | ICS1562BM-201-4LFT |
| 廠商： | IDT, Integrated Device Technology Inc |
| 文件頁數(shù)： | 9/20頁 |
| 文件大?。?/td> | 0K |
| 描述： | IC VIDEO CLK SYNTHESIZER 16-SOIC |
| 標(biāo)準(zhǔn)包裝： | 2,500 |
| 類型： | 時(shí)鐘/頻率合成器，時(shí)鐘發(fā)生器，扇出配送 |
| PLL： | 是 |
| 輸入： | CMOS，TTL，晶體 |
| 輸出： | CMOS，PECL |
| 電路數(shù)： | 1 |
| 比率 - 輸入:輸出： | 1:3 |
| 差分 - 輸入:輸出： | 無/是 |
| 頻率 - 最大： | 260MHz |
| 除法器/乘法器： | 是/是 |
| 電源電壓： | 4.75 V ~ 5.25 V |
| 工作溫度： | 0°C ~ 70°C |
| 安裝類型： | 表面貼裝 |
| 封裝/外殼： | 16-SOIC（0.154"，3.90mm 寬） |
| 供應(yīng)商設(shè)備封裝： | 16-SOIC |
| 包裝： | 帶卷 (TR) |
| 其它名稱： | 1562BM-201-4LFT |
AC Characteristics
SYMBOL
PARAMETER
MIN
TYP
MAX
UNITS
Fvco
VCO Frequency (see Note 1)
40
260
MHz
Fxtal
Crystal Frequency
5
20
MHz
Cpar
Crystal Oscillator Loading Capacitance
20
pf
Fload
LOAD Frequency
80
MHz
Txhi
XTAL1 High Time (when driven externally)
8
ns
Txlo
XTAL1 Low Time (when driven externally)
8
ns
Tlock
PLL Acquire Time (to within 1%)
500
s
Idd
VDD Supply Current
15
t.b.d.
mA
Iddo
VDDO Supply Current (excluding CLK+/
termination)
20
t.b.d.
mA
Thigh
Differential Clock Output Duty Cycle
(see Note 2)
45
55
%
Jclk
Differential Clock Output Cumulative Jitter
(see Note 3)
<0.06
pixel
DIGITAL INPUTS - ICS1562B-001
1
Address Setup Time
10
ns
2
Address Hold Time
10
ns
3
Data Setup Time
10
ns
4
Data Hold Time
10
ns
5
STROBE Pulse Width (Thi or Tlo)20
ns
DIGITAL INPUTS - ICS1562B-201
6
DATA/HOLD~ Setup Time
10
ns
7
DATA/HOLD~ Hold Time
10
ns
8
DATCLK Pulse Width (Thi or Tlo)20
ns
PIPELINE DELAY RESET
9
Reset Activation Time
2*Tclk
ns
10
Reset Duration
4*Tload
ns
11
Restart Delay
2*Tload
ns
12
Restart Matching
-1*Tclk
+1.5*Tclk
ns
DIGITAL OUTPUTS
CLK+/CLK
Clock Rate
260
MHz
14
LOAD To LD/N2 Skew (Shift Clock Mode)
-2
0
+2
ns
Note 1: Use of the post-divider is required for frequencies lower than 40 MHz on CLK+ & CLK- outputs. Use of the post-divider
is recommended for output frequencies lower than 65 MHz.
Note 2: Using load circuit of Figure 6. Duty cycle measured at zero crossings of difference voltage between CLK+ and CLK-.
Note 3: Cumulative jitter is defined as the maximum error (in the domain) if any CLK edge, at any point in time, compared with
the equivalent edge generated by an ideal frequency source.
ICS laboratory testing indicates that the typical value shown above can be treated as a maximum jitter specification in
virtually all applications. Jitter performance can depend somewhat on circuit board layout, decoupling, and register
programming.
ICS1562B
17
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