Specifications ispLSI 1016 4 Switching Test Conditions Input Pulse Levels GND to 3.0V Input Rise and Fall Time ≤ 3ns 10% to 90% Input Timing Re" />
參數(shù)資料
型號(hào): ISPLSI 1016-90LT44
廠商: Lattice Semiconductor Corporation
文件頁(yè)數(shù): 13/17頁(yè)
文件大?。?/td> 0K
描述: IC PLD ISP 32I/O 12NS 44TQFP
標(biāo)準(zhǔn)包裝: 160
系列: ispLSI® 1000
可編程類(lèi)型: 系統(tǒng)內(nèi)可編程
最大延遲時(shí)間 tpd(1): 12.0ns
電壓電源 - 內(nèi)部: 4.75 V ~ 5.25 V
邏輯元件/邏輯塊數(shù)目: 16
門(mén)數(shù): 2000
輸入/輸出數(shù): 32
工作溫度: 0°C ~ 70°C
安裝類(lèi)型: 表面貼裝
封裝/外殼: 44-TQFP
供應(yīng)商設(shè)備封裝: 44-TQFP(10x10)
包裝: 托盤(pán)
其它名稱(chēng): ISPLSI1016-90LT44
Specifications ispLSI 1016
4
Switching Test Conditions
Input Pulse Levels
GND to 3.0V
Input Rise and Fall Time
≤ 3ns 10% to 90%
Input Timing Reference Levels
1.5V
Output Timing Reference Levels
1.5V
Output Load
See figure 2
3-state levels are measured 0.5V from steady-state
active level.
Table 2- 0003
Output Load Conditions (see figure 2)
Test Condition
R1
R2
CL
A
470Ω
390Ω
35pF
B
Active High
390Ω
35pF
Active Low
470Ω
390Ω
35pF
Active High to Z
390Ω
5pF
Cat V
OH - 0.5V
Active Low to Z
470Ω
390Ω
5pF
at V
OL + 0.5V
Table 2- 0004A
Figure 2. Test Load
+ 5V
R1
R2
CL*
Device
Output
Test
Point
*CL includes Test Fixture and Probe Capacitance.
DC Electrical Characteristics
Over Recommended Operating Conditions
0.4
-10
10
-150
-200
150
170
VOL
VOH
IIL
IIH
IIL-isp
IIL-PU
IOS1
ICC2,4
I
OL =8 mA
I
OH =-4 mA
0V ≤ VIN ≤ VIL (MAX.)
3.5V ≤ VIN ≤ VCC
0V ≤ VIN ≤ VIL (MAX.)
0V ≤ VIN ≤ VIL
V
CC = 5V, VOUT = 0.5V
V
IL = 0.5V, VIH = 3.0V
Commercial
f
TOGGLE = 1 MHz
Industrial/Military
100
2.4
CONDITION
PARAMETER
SYMBOL
MIN.
MAX.
Output Low Voltage
Output High Voltage
Input or I/O Low Leakage Current
Input or I/O High Leakage Current
isp Input Low Leakage Current
I/O Active Pull-Up Current
Output Short Circuit Current
Operating Power Supply Current
UNITS
TYP.3
V
μA
mA
1. One output at a time for a maximum duration of one second. V
out = 0.5V was selected to avoid test problems by tester ground
degradation. Characterized but not 100% tested.
2. Measured using four 16-bit counters.
3. Typical values are at V
CC = 5V and TA = 25
oC.
4. Maximum I
CC varies widely with specific device configuration and operating frequency. Refer to the Power Consumption sec-
tion of this datasheet and Thermal Management section of the Lattice Semiconductor Data Book or CD-ROM to estimate maximum
I
CC.
Table 2-0007A-16 w/mil
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DEVICES
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