參數(shù)資料
型號: KMM364E400CK
廠商: SAMSUNG SEMICONDUCTOR CO. LTD.
英文描述: 4Mx64 DRAM DIMM(4Mx64 動態(tài) RAM模塊)
中文描述: 4Mx64的DRAM內存(4Mx64動態(tài)內存模塊)
文件頁數(shù): 6/20頁
文件大?。?/td> 391K
代理商: KMM364E400CK
DRAM MODULE
KMM364E410CK/CS
KMM364E400CK/CS
NOTES
An initial pause of 200us is required after power-up followed
by any 8 RAS-only or CAS-before-RAS refresh cycles before
proper device operation is achieved.
Input voltage levels are Vih/Vil. V
IH
(min) and V
IL
(max) are
reference levels for measuring timing of input signals. Transi-
tion times are measured between V
IH
(min) and V
IL
(max) and
are assumed to be 5ns for all inputs.
Measured with a load equivalent to 2TTL loads and 100pF.
Operation within the
t
RCD
(max) limit insures that
t
RAC
(max)
can be met.
t
RCD
(max) is specified as a reference point only.
If
t
RCD
is greater than the specified
t
RCD
(max) limit, then
access time is controlled exclusively by
t
CAC
.
Assumes that
t
RCD
t
RCD
(max).
This parameter defines the time at which the output achieves
the open circuit condition and is not referenced to V
OH
or
V
OL
.
t
WCS
,
t
RWD
,
t
CWD
and
t
AWD
are non restrictive operating
parameter. They are included in the data sheet as electrical
characteristics only. If
t
WCS
t
WCS
(min) the cycle is an early
write cycle and the data out pin will remain high impedance
for the duration of the cycle.
If
t
CWD
t
CWD
(min),
t
RWD
t
RWD
(min) and
t
AWD
t
AWD
(min),
then the cycle is a read-write cycle and the data output will
contain data read from the selected address. If neither of the
above conditions are satisfied, the condition of the data
out(at access time) is indeterminated.
Either
t
RCH
or
t
RRH
must be satisfied for a read cycle.
These parameters are referenced to the CAS leading edge in
early write cycles and to the W leading edge in read-write
cycles.
Operation within the
t
RAD
(max) limit insures that
t
RAC
(max)
can be met.
t
RAD
(max) is specified as reference point only. If
t
RAD
is greater than the specified
t
RAD
(max) limit, then
access time is controlled by
t
AA
.
t
CEZ
(max),
t
REZ
(max),
t
WEZ
(max) and
t
OEZ
(max) define the
time at which the output achieves the open circuit condition
and are not referenced to output voltage level.
If RAS goes to high before CAS high going, the open circuit
condition of the output is achieved by CAS high going. If CAS
goes to high before RAS high going , the open circuit condi-
tion of the output is achieved by RAS high going.
t
ASC
t
CP
min
The timing skew from the DRAM to the DIMM resulted from
the addition of buffers.
1.
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相關PDF資料
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