參數(shù)資料
型號(hào)： KMM377S3320T1
廠商： SAMSUNG SEMICONDUCTOR CO. LTD.
英文描述： 32Mx72 SDRAM DIMM(32M x 72 動(dòng)態(tài) RAM模塊)
中文描述： 32Mx72 SDRAM的內(nèi)存（32M × 72配置動(dòng)態(tài)內(nèi)存模塊）
文件頁(yè)數(shù)： 8/14頁(yè)
文件大?。?/td> 215K
代理商： KMM377S3320T1
REV. 4 July 1998
Preliminary
KMM377S3320T1
SDRAM MODULE
OPERATING AC PARAMETER
(AC operating conditions unless otherwise noted)
Parameter
Symbol
Version
Unit
Note
-8
-H
-L
Row active to row active delay
t
RRD
(min)
16
20
20
ns
1
RAS to CAS delay
t
RCD
(min)
20
20
20
ns
1
Row precharge time
t
RP
(min)
20
20
20
ns
1
Row active time
t
RAS
(min)
48
50
50
ns
1
t
RAS
(max)
100
us
Row cycle time
t
RC
(min)
68
70
70
ns
1
Last data in to new col. address delay
t
CDL
(min)
1
CLK
2
Last data in to row precharge
t
RDL
(min)
1
CLK
2
Last data in to burst stop
t
BDL
(min)
1
CLK
2
Col. address to col. address delay
t
CCD
(min)
1
CLK
3
Number of valid output data
CAS latency=3
2
ea
4
CAS latency=2
1
3.3V
1200
870
Output
50pF
V
OH
(DC) = 2.4V, I
OH
= -2mA
V
OL
(DC) = 0.4V, I
OL
= 2mA
Vtt = 1.4V
50
Output
50pF
Z0 = 50
(Fig. 2) AC output load circuit
(Fig. 1) DC output load circuit
AC OPERATING TEST CONDITIONS
(V
DD
= 3.3V
±
0.3V, T
A
= 0 to 70
°
C)
Parameter
Value
Unit
AC input levels (Vih/Vil)
2.4/0.4
V
Input timing measurement reference level
1.4
V
Input rise and fall time
tr/tf = 1/1
ns
Output timing measurement reference level
1.4
V
Output load condition
See Fig. 2
1. The minimum number of clock cycles is determined by dividing the minimum time required with clock cycle time
and then rounding off to the next higher integer.
2. Minimum delay is required to complete write in Reg. DIMM (1 CLK earlier than Unbuff. DIMM)
3. All parts allow every cycle column address change.
4. In case of row precharge interrupt, auto precharge and read burst stop.
Notes :
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