參數(shù)資料
型號(hào): KMPC8314CVRAGDA
廠商: Freescale Semiconductor
文件頁(yè)數(shù): 40/101頁(yè)
文件大小: 0K
描述: IC MPU POWERQUICC II 620-PBGA
標(biāo)準(zhǔn)包裝: 2
系列: MPC83xx
處理器類(lèi)型: 32-位 MPC83xx PowerQUICC II Pro
速度: 400MHz
電壓: 1V
安裝類(lèi)型: 表面貼裝
封裝/外殼: 620-BBGA 裸露焊盤(pán)
供應(yīng)商設(shè)備封裝: 620-PBGA(29x29)
包裝: 托盤(pán)
MPC8314E PowerQUICC II Pro Processor Hardware Specifications, Rev. 2
Freescale Semiconductor
43
JTAG
12.2
JTAG AC Timing Specifications
This section describes the AC electrical specifications for the IEEE 1149.1 (JTAG) interface. This table
provides the JTAG AC timing specifications as defined in Figure 28 through Figure 31.
Table 46. JTAG AC Timing Specifications (Independent of SYS_CLK_IN) 1
At recommended operating conditions (see Table 2)
Parameter
Symbol 2
Min
Max
Unit
Note
JTAG external clock frequency of operation
fJTG
033.3
MHz
JTAG external clock cycle time
t JTG
30
ns
JTAG external clock pulse width measured at 1.4 V
tJTKHKL
15
ns
JTAG external clock rise and fall times
tJTGR, tJTGF
02
ns
TRST assert time
tTRST
25
ns
3
Input setup times:
Boundary-scan data
TMS, TDI
tJTDVKH
tJTIVKH
4
ns
4
Input hold times:
Boundary-scan data
TMS, TDI
tJTDXKH
tJTIXKH
10
ns
4
Valid times:
Boundary-scan data
TDO
tJTKLDV
tJTKLOV
2
11
ns
5
Output hold times:
Boundary-scan data
TDO
tJTKLDX
tJTKLOX
2
ns
5
JTAG external clock to output high impedance:
Boundary-scan data
TDO
tJTKLDZ
tJTKLOZ
2
19
9
ns
5, 6
Note:
1. All outputs are measured from the midpoint voltage of the falling/rising edge of tTCLK to the midpoint of the signal in question.
The output timings are measured at the pins. All output timings assume a purely resistive 50-
load (see Table 27).
Time-of-flight delays must be added for trace lengths, vias, and connectors in the system.
2. The symbols used for timing specifications herein follow the pattern of t(first two letters of functional block)(signal)(state) (reference)(state)
for inputs and t(first two letters of functional block)(reference)(state)(signal)(state) for outputs. For example, tJTDVKH symbolizes JTAG device
timing (JT) with respect to the time data input signals (D) reaching the valid state (V) relative to the tJTG clock reference (K)
going to the high (H) state or setup time. Also, tJTDXKH symbolizes JTAG timing (JT) with respect to the time data input signals
(D) went invalid (X) relative to the tJTG clock reference (K) going to the high (H) state. Note that, in general, the clock reference
symbol representation is based on three letters representing the clock of a particular functional. For rise and fall times, the
latter convention is used with the appropriate letter: R (rise) or F (fall).
3. TRST is an asynchronous level sensitive signal. The setup time is for test purposes only.
4. Non-JTAG signal input timing with respect to tTCLK.
5. Non-JTAG signal output timing with respect to tTCLK.
6. Guaranteed by design and characterization.
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