Data Sheet
August 1999
LG1600FXH Clock and Data Regenerator
8
Lucent Technologies Inc.
Absolute Maximum Ratings
Stresses in excess of the absolute maximum ratings can cause permanent or latent damage to the device. These
are absolute stress ratings only. Functional operation of the device is not implied at these or any other conditions in
excess of those given in the operational sections of the data sheet. Exposure to absolute maximum ratings for
extended periods can adversely affect device reliability.
Table 2. Absolute Maximum Ratings
Recommended Operating Conditions
Table 3. Recommended Operating Conditions
Handling Precautions
Although protection circuitry has been designed into this device, proper precautions should be taken to avoid expo-
sure to electrostatic discharge (ESD) during handling and mounting. Lucent Technologies Microelectronics Group
employs a human-body model (HBM) for ESD-susceptibility testing and protection design evaluation. The HBM
(resistance = 1500
, capacitance = 100 pF) is used. The HBM ESD threshold presented in Table 4 was obtained
by using these circuit parameters.
Table 4. ESD Threshold
Mounting and Connections
Certain precautions must be taken when using solder. For installation using a constant temperature solder, temper-
atures of under 300 °C may be employed for periods of time up to 5 seconds, maximum. For installation with a sol-
dering iron (battery operated or nonswitching only), the soldering tip temperature should not be greater than
300 °C and the soldering time for each lead must not exceed 5 seconds.
Parameter
Min
Max
Unit
Supply Voltage Range (V
SS
)
Loss of Signal Bias Voltage (V
DD
)
Power Dissipation
Voltage (all pins)
Transient Voltage to ac Couple Pins (V
±IN
, R
EXT
)
Storage Temperature Range
Operating Temperature Range
–7
—
—
V
SS
—
–40
–40
0.5
7
2
0.5
±3
125
100
V
V
W
V
V
°C
°C
Parameter
Symbol
Min
Max
Unit
Case Temperature
Power Supply
t
CASE
V
SS
0
70
–5.7
°C
V
–4.7
HBM ESD Threshold
Device
LG1600FXH
Voltage
≥
200 V