參數(shù)資料
型號: LPC11U24FBD64/401
廠商: NXP Semiconductors
文件頁數(shù): 21/74頁
文件大小: 0K
描述: IC MCU USB 64LQFP
產(chǎn)品培訓(xùn)模塊: Code Density for LPC11xx
標(biāo)準(zhǔn)包裝: 160
系列: LPC11Uxx
核心處理器: ARM? Cortex?-M0
芯體尺寸: 32-位
速度: 50MHz
連通性: I²C,Microwire,SPI,SSI,SSP,UART/USART,USB
外圍設(shè)備: 欠壓檢測/復(fù)位,POR,WDT
輸入/輸出數(shù): 54
程序存儲器容量: 32KB(32K x 8)
程序存儲器類型: 閃存
EEPROM 大?。?/td> 4K x 8
RAM 容量: 10K x 8
電壓 - 電源 (Vcc/Vdd): 1.8 V ~ 3.6 V
數(shù)據(jù)轉(zhuǎn)換器: A/D 8x10b
振蕩器型: 內(nèi)部
工作溫度: -40°C ~ 85°C
封裝/外殼: 64-LQFP
包裝: 托盤
其它名稱: 568-8461
LPC11U24FBD64/401,551
LPC11U2X
All information provided in this document is subject to legal disclaimers.
NXP B.V. 2014. All rights reserved.
Product data sheet
Rev. 2.2 — 11 March 2014
28 of 74
NXP Semiconductors
LPC11U2x
32-bit ARM Cortex-M0 microcontroller
7.18 Emulation and debugging
Debug functions are integrated into the ARM Cortex-M0. Serial wire debug functions are
supported in addition to a standard JTAG boundary scan. The ARM Cortex-M0 is
configured to support up to four breakpoints and two watch points.
The RESET pin selects between the JTAG boundary scan (RESET = LOW) and the ARM
SWD debug (RESET = HIGH). The ARM SWD debug port is disabled while the
LPC11U2x is in reset.
To perform boundary scan testing, follow these steps:
1. Erase any user code residing in flash.
2. Power up the part with the RESET pin pulled HIGH externally.
3. Wait for at least 250
s.
4. Pull the RESET pin LOW externally.
5. Perform boundary scan operations.
6. Once the boundary scan operations are completed, assert the TRST pin to enable the
SWD debug mode, and release the RESET pin (pull HIGH).
Remark: The JTAG interface cannot be used for debug purposes.
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