參數(shù)資料
型號(hào)： LTC2145IUP-14#TRPBF
廠商： Linear Technology
文件頁(yè)數(shù)： 20/38頁(yè)
文件大小： 0K
描述： IC ADC DUAL 14BIT 125MSPS 64-QFN
標(biāo)準(zhǔn)包裝： 2,000
位數(shù)： 14
采樣率（每秒）： 125M
數(shù)據(jù)接口： 并聯(lián)，串行，SPI
轉(zhuǎn)換器數(shù)目： 2
功率耗散（最大）： 360mW
電壓電源： 模擬和數(shù)字
工作溫度： -40°C ~ 85°C
安裝類型： 表面貼裝
封裝/外殼： 64-WFQFN 裸露焊盤
供應(yīng)商設(shè)備封裝： 64-QFN（9x9）
包裝： 帶卷 (TR)
輸入數(shù)目和類型： 2 個(gè)差分
配用： DC890B-ND - BOARD USB DATA COLLECTION
27
21454314fa
LTC2145-14/
LTC2144-14/LTC2143-14
allowed so the on-chip references can settle from the slight
temperature shift caused by the change in supply current
as the A/D leaves nap mode. Either channel 2 or both chan-
nels can be placed in nap mode; it is not possible to have
channel 1 in nap mode and channel 2 operating normally.
Sleep mode and nap mode are enabled by mode control
register A1 (serial programming mode), or by SDI and
SDO (parallel programming mode).
DEVICE PROGRAMMING MODES
The operating modes of the LTC2145-14/LTC2144-14/
LTC2143-14 can be programmed by either a parallel in-
terface or a simple serial interface. The serial interface has
more flexibility and can program all available modes. The
parallel interface is more limited and can only program
some of the more commonly used modes.
Parallel Programming Mode
To use the parallel programming mode, PAR/SER should
be tied to VDD. The CS, SCK, SDI and SDO pins are binary
logic inputs that set certain operating modes. These pins
can be tied to VDD or ground, or driven by 1.8V, 2.5V, or
3.3V CMOS logic. When used as an input, SDO should
be driven through a 1k series resistor. Table 2 shows the
modes set by CS, SCK, SDI and SDO.
Table 2. Parallel Programming Mode Control Bits (PAR/SER = VDD)
PIN
DESCRIPTION
CS
Clock Duty Cycle Stabilizer Control Bit
0 = Clock Duty Cycle Stabilizer Off
1 = Clock Duty Cycle Stabilizer On
SCK
Digital Output Mode Control Bit
0 = Full Rate CMOS Output Mode
1 = Double Data Rate LVDS Output Mode
(3.5mA LVDS Current, Internal Termination Off)
SDI/SDO Power Down Control Bit
00 = Normal Operation
01 = Channel 1 in Normal Operation, Channel 2 in Nap Mode
10 = Channel 1 and Channel 2 in Nap Mode
11 = Sleep Mode (Entire Device Powered Down)
APPLICATIONS INFORMATION
Digital Output Test Patterns
To allow in-circuit testing of the digital interface to the
A/D, there are several test modes that force the A/D data
outputs (OF, D13-D0) to known values:
All 1s: All outputs are 1
All 0s: All outputs are 0
Alternating: Outputs change from all 1s to all 0s on
alternating samples.
Checkerboard: Outputs change from
101010101010101 to 010101010101010 on alternat-
ing samples.
The digital output test patterns are enabled by serially
programming mode control register A4. When enabled,
the Test Patterns override all other formatting modes: 2’s
complement, randomizer, alternate bit polarity.
Output Disable
The digital outputs may be disabled by serially program-
ming mode control register A3. All digital outputs including
OF and CLKOUT are disabled. The high-impedance disabled
state is intended for in-circuit testing or long periods of
inactivity – it is too slow to multiplex a data bus between
multiple converters at full speed. When the outputs are
disabled both channels should be put into either sleep or
nap mode.
Sleep and Nap Modes
The A/D may be placed in sleep or nap modes to conserve
power. In sleep mode the entire device is powered down,
resulting in 1mW power consumption. The amount of time
required to recover from sleep mode depends on the size
of the bypass capacitors on VREF, REFH, and REFL. For the
suggested values in Fig. 8, the A/D will stabilize after 2ms.
In nap mode the A/D core is powered down while the internal
reference circuits stay active, allowing faster wakeup than
from sleep mode. Recovering from nap mode requires at
least 100 clock cycles. If the application demands very
accurate DC settling then an additional 50μs should be
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