參數(shù)資料
型號(hào): MA17502
廠商: Dynex Semiconductor Ltd.
英文描述: Radiation Hard MIL-STD-1750A Control Unit
中文描述: 輻射硬的MIL - STD - 1750A控制單元
文件頁(yè)數(shù): 29/30頁(yè)
文件大?。?/td> 272K
代理商: MA17502
MA17502
29/30
10.0 RADIATION TOLERANCE
Total Dose Radiation Testing
For product procured to guaranteed total dose radiation
levels, each wafer lot will be approved when all sample devices
from each lot pass the total dose radiation test.
The sample devices will be subjected to the total dose
radiation level (Cobalt-60 Source), defined by the ordering
code, and must continue to meet the electrical parameters
specified in the data sheet. Electrical tests, pre and post
irradiation, will be read and recorded.
Dynex Semiconductor can provide radiation testing
compliant with Mil-Std-883 method 1019 Ionizing Radiation
(total dose) test.
11.0 ORDERING INFORMATION
For details of reliability, QA/QC, test and assembly
options, see ‘Manufacturing Capability and Quality
Assurance Standards’ Section 9.
Unique Circuit Designator
S
R
Q
Radiation Hard Processing
100 kRads (Si) Guaranteed
300 kRads (Si) Guaranteed
Radiation Tolerance
C
F
L
Ceramic DIL (Solder Seal)
Flatpack (Solder Seal)
Leadless Chip Carrier
Package Type
QA/QCI Process
(See Section 9 Part 4)
Test Process
(See Section 9 Part 3)
Assembly Process
(See Section 9 Part 2)
L
C
D
E
B
S
Rel 0
Rel 1
Rel 2
Rel 3/4/5/STACK
Class B
Class S
Reliability Level
MAx17502xxxxx
Total Dose (Function to specification)*
3x10
5
Rad(Si)
Transient Upset (Stored data loss)
1x10
11
Rad(Si)/sec
Transient Upset (Survivability)
>1x10
12
Rad(Si)/sec
Neutron Hardness (Function to specification)
>1x10
15
n/cm
2
Single Event Upset**
<1x10
-10
Errors/bit day
Latch Up
Not possible
* Other total dose radiation levels available on request
** Worst case galactic cosmic ray upset - interplanetary/high altitude orbit
Table 10: Radiation Hardness Parameters
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