參數(shù)資料
型號: MAX19711ETN+T
廠商: Maxim Integrated Products
文件頁數(shù): 27/36頁
文件大?。?/td> 0K
描述: IC ANLG FRNT END 56-TQFN
產(chǎn)品變化通告: Product Discontinuation 09/Jun/2011
標(biāo)準(zhǔn)包裝: 2,500
位數(shù): 10
通道數(shù): 2
功率(瓦特): 37.5mW
電壓 - 電源,模擬: 3V
電壓 - 電源,數(shù)字: 3V
封裝/外殼: 56-WFQFN 裸露焊盤
供應(yīng)商設(shè)備封裝: 56-TQFN-EP(7x7)
包裝: 帶卷 (TR)
MAX19711
10-Bit, 11Msps, Full-Duplex
Analog Front-End
______________________________________________________________________________________
33
Dynamic Parameter Definitions
ADC and DAC Static Parameter Definitions
Integral Nonlinearity (INL)
Integral nonlinearity is the deviation of the values on an
actual transfer function from a straight line. This straight
line can be either a best-straight-line fit or a line drawn
between the end points of the transfer function, once
offset and gain errors have been nullified. The static lin-
earity parameters for the device are measured using
the best-straight-line fit (DAC Figure 15a).
Differential Nonlinearity (DNL)
Differential nonlinearity is the difference between an
actual step width and the ideal value of 1 LSB. A DNL
error specification of less than 1 LSB guarantees no
missing codes (ADC) and a monotonic transfer function
(ADC and DAC) (DAC Figure 15b).
ADC Offset Error
Ideally, the midscale transition occurs at 0.5 LSB above
midscale. The offset error is the amount of deviation
between the measured transition point and the ideal
transition point.
DAC Offset Error
Offset error (Figure 15a) is the difference between the
ideal and actual offset point. The offset point is the out-
put value when the digital input is midscale. This error
affects all codes by the same amount and usually can
be compensated by trimming.
ADC Gain Error
Ideally, the ADC full-scale transition occurs at 1.5 LSB
below full scale. The gain error is the amount of devia-
tion between the measured transition point and the
ideal transition point with the offset error removed.
ADC Dynamic Parameter Definitions
Aperture Jitter
Figure 16 shows the aperture jitter (tAJ), which is the
sample-to-sample variation in the aperture delay.
Aperture Delay
Aperture delay (tAD) is the time defined between the
rising edge of the sampling clock and the instant when
an actual sample is taken (Figure 16).
Signal-to-Noise Ratio (SNR)
For a waveform perfectly reconstructed from digital
samples, the theoretical maximum SNR is the ratio of
the full-scale analog input (RMS value) to the RMS
quantization error (residual error) and results directly
from the ADC’s resolution (N bits):
SNR(max) = 6.02 x N + 1.76 (in dB)
HOLD
ANALOG
INPUT
SAMPLED
DATA (T/H)
T/H
tAD
tAJ
TRACK
CLK
Figure 16. T/H Aperture Timing
0
2
1
4
3
7
6
5
000
010
001
011
100
101
110
AT STEP
011 (0.5 LSB)
AT STEP
001 (0.25 LSB)
111
DIGITAL INPUT CODE
ANALOG
OUTPUT
VALUE
Figure 15a. Integral Nonlinearity
0
2
1
4
3
6
5
000
010
001
011
100
101
DIFFERENTIAL LINEARITY
ERROR (-0.25 LSB)
DIFFERENTIAL
LINEARITY ERROR (+0.25 LSB)
1 LSB
DIGITAL INPUT CODE
ANALOG
OUTPUT
VALUE
Figure 15b. Differential Nonlinearity
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