參數(shù)資料
型號(hào)： MB8117400B-50
廠商： Fujitsu Limited
英文描述： 4 M ×4 BITS Fast Page Mode Dynamic RAM(CMOS 4 M ×4 位快速頁(yè)面存取模式RAM)
中文描述： 4米× 4位快速頁(yè)面模式動(dòng)態(tài)RAM（的CMOS 4米× 4位快速頁(yè)面存取模式的RAM）
文件頁(yè)數(shù)： 12/28頁(yè)
文件大?。?/td> 473K
代理商： MB8117400B-50
12
MB8117400B-50/-60
Notes:
*1.
Referenced to V
SS
.
I
CC
depends on the output load conditions and cycle rates; the specified values are obtained with the
output open. I
CC
depends on the number of address change as RAS = V
IL
, CAS = V
IH
and V
IL
> –0.3V.
I
CC1
, I
CC3
, I
CC4
and I
CC5
are specified at one time of address change during RAS = V
IL
and CAS = V
IH
. I
CC2
is specified during RAS = V
IH
and V
IL
> –0.3 V.
An initial pause (RAS = CAS = V
IH
) of 200
μ
s is required after power-up followed by any eight RAS-only
cycles before proper device operation is achieved. In case of using internal refresh counter, a minimum
of eight CAS-before-RAS initialization cycles instead of 8 RAS cycles are required.
AC characteristics assume t
T
= 5 ns.
V
IH
(min) and V
IL
(max) are reference levels for measuring timing of input signals. Also transition times
are measured between V
IH
(min) and V
IL
(max).
Assumes that t
RCD
≤
t
RCD
(max), t
RAD
≤
t
RAD
(max). If t
RCD
is greater than the maximum recommended
value shown in this table, t
RAC
will be increased by the amount that t
RCD
exceeds the value shown. Refer
to Fig. 2 and 3.
If t
RCD
≥
t
RCD
(max), t
RAD
≥
t
RAD
(max), and t
ASC
≥
t
AA
– t
CAC
– t
T
, access time is t
CAC
.
If t
RAD
≥
t
RAD
(max) and t
ASC
≤
t
AA
– t
CAC
– t
T
, access time is t
AA
.
Measured with a load equivalent to two TTL loads and 100 pF.
t
OFF
and t
OEZ
is specified that output buffer change to high-impedance state.
Operation within the t
RCD
(max) limit ensures that t
RAC
(max) can be met. t
RCD
(max) is specified as a
reference point only; if t
RCD
is greater than the specified t
RCD
(max) limit, access time is controlled
exclusively by t
CAC
or t
AA
.
t
RCD
(min) = t
RAH
(min)+ 2 t
T
+ t
ASC
(min).
Operation within the t
RAD
(max) limit ensures that t
RAC
(max) can be met. t
RAD
(max) is specified as a
reference point only; if t
RAD
is greater than the specified t
RAD
(max) limit, access time is controlled
exclusively by t
CAC
or t
AA
.
Either t
RRH
or t
RCH
must be satisfied for a read cycle.
t
WCS
is specified as a reference point only. If t
WCS
≥
t
WCS
(min) the data output pin will remain High-Z
state through entire cycle.
Assumes that t
WCS
< t
WCS
(min).
Either t
DZC
or t
DZO
must be satisfied.
t
CPA
is access time from the selection of a new column address (that is caused by changing CAS from
“L” to “H”). Therefore, if t
CP
is long, t
CPA
is longer than t
CPA
(max).
Assumes that CAS-before-RAS refresh.
t
WCS
, t
CWD
, t
RWD
and t
AWD
are not restrictive operating parameters. They are included in the data sheet
as an electrical characteristic only. If t
WCS
> t
WCS
(min), the cycle is an early write cycle and DQ pin
will maintain high-impedance state thoughout the entire cycle. If t
CWD
> t
CWD
(min), t
RWD
> t
RWD
(min),
and t
AWD
> t
AWD
(min), the cycle is a read modify-write cycle and data from the selected cell will appear
at the DQ pin. If neither of the above conditions is satisfied, the cycle is a delayed write cycle and
invalid data will appear the DQ pin , and write operation can be executed by satisfying t
RWL
, t
CWL
, and
t
RAL
specifications.
*2.
*3.
*4.
*5.
*6.
*7.
*8.
*9.
*10.
*11.
*12.
*13.
*14.
*15.
*16.
*17.
*18.
*19.
*20.
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