參數(shù)資料
型號: MBM29F017-90
廠商: Fujitsu Limited
英文描述: 16M (2M ×8) Bit Flash Memory( 單5V 電源電壓2M ×8閃速存儲器)
中文描述: 1,600(2米× 8)位快閃記憶體(單5V的電源電壓200萬× 8閃速存儲器)
文件頁數(shù): 20/48頁
文件大?。?/td> 548K
代理商: MBM29F017-90
20
MBM29F017
-90/-12
Data Protection
The MBM29F017 is designed to offer protection against accidental erasure or programming caused by spurious
system level signals that may exist during power transitions. During power up the device automatically resets
the internal state machine in the Read mode. Also, with its control register architecture, alteration of the memory
contents only occurs after successful completions of specific multi-bus cycle command sequences.
The device also incorporates several features to prevent inadvertent write cycles resulting from V
CC
power-up
and power-down transitions or system noise.
Low V
CC
Write Inhibit
To avoid initiation of a write cycle during V
CC
power-up and power-down, a write cycle is locked out for V
CC
less
than 3.2 V (typically 3.7 V). If V
CC
< V
LKO
, the command register is disabled and all internal program/erase circuits
are disabled. Under this condition the device will reset to the read mode. Subsequent writes will be ignored until
the V
CC
level is greater than V
LKO
. It is the users responsibility to ensure that the control pins are logically correct
to prevent unintentional writes when V
CC
is above 3.2 V.
Write Pulse “Glitch” Protection
Noise pulses of less than 5 ns (typical) on OE, CE, or WE will not initiate a write cycle.
Logical Inhibit
Writing is inhibited by holding any one of OE = V
IL
, CE = V
IH
or WE = V
IH
. To initiate a write cycle CE and WE
must be a logical zero while OE is a logical one.
Power-Up Write Inhibit
Power-up of the device with WE = CE = V
IL
and OE = V
IH
will not accept commands on the rising edge of WE.
The internal state machine is automatically reset to the read mode on power-up.
Handling of SON Package
The metal portion of marking side is connected with internal chip electrically. Please pay attention not to occur
electrical connection during operation. In worst case, it may be caused permanent damage to device or system
by excessive current.
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