參數(shù)資料
型號(hào): MBM29F080A-70
廠商: Fujitsu Limited
英文描述: 8M (1M X 8) BIT
中文描述: 8米(1米× 8)位
文件頁數(shù): 25/47頁
文件大?。?/td> 564K
代理商: MBM29F080A-70
25
MBM29F080A
-55/-70/-90
I
AC CHARACTERISTICS
Read Only Operations Characteristics
Note: 1. Test Conditions:
Output Load: 1 TTL gate and 30 pF
Input rise and fall times: 5 ns
Input pulse levels: 0.0 V to 3.0 V
Timing measurement reference level
Input: 1.5 V
Output: 1.5 V
Parameter
Symbols
Description
Test Setup
-55
(Note1)
-70
(Note2)
-90
(Note2)
Unit
JEDEC Standard
t
AVAV
t
RC
Read Cycle Time
Min.
55
70
90
ns
t
AVQV
t
ACC
Address to Output Delay
CE = V
IL
OE = V
IL
Max.
55
70
90
ns
t
ELQV
t
CE
Chip Enable to Output Delay
OE = V
IL
Max.
55
70
90
ns
t
GLQV
t
OE
Output Enable to Output Delay
Max.
30
30
40
ns
t
EHQZ
t
DF
Chip Enable to Output HIGH-Z
Max.
20
20
20
ns
t
GHQZ
t
DF
Output Enable to Output HIGH-Z
Max.
20
20
20
ns
t
AXQX
t
OH
Output Hold Time From Addresses,
CE or OE, Whichever Occurs First
Min.
0
0
0
ns
t
READY
RESET Pin Low to Read Mode
Max.
20
20
20
μ
s
Figure 4 Test Conditions
Notes:
1. MBM29F080A-55: C
L
= 30 pF including jig capacitance
2. MBM29F080A-70/-90: C
L
= 100 pF including jig capacitance
C
L
5.0 V
Diodes = IN3064
or Equivalent
2.7 k
Device
Under
Test
IN3064
or Equivalent
6.2 k
Note: 2. Test Conditions:
Output Load: 1 TTL gate and 100 pF
Input rise and fall times: 5 ns
Input pulse levels: 0.45 V to 2.4 V
Timing measurement reference level
Input: 0.8 V and 2.0 V
Output: 0.8 V and 2.0 V
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