參數(shù)資料
型號(hào): MBM29LV080A-90
廠商: Fujitsu Limited
英文描述: 8M (1M x 8) BIT
中文描述: 8米(1米× 8)位
文件頁(yè)數(shù): 25/49頁(yè)
文件大小: 400K
代理商: MBM29LV080A-90
MBM29LV080A
-70/-90/-12
25
I
AC CHARACTERISTICS
Read Only Operations Characteristics
Parameter
Symbols
Note: Test Conditions: Output Load: 1 TTL gate and 30 pF (MBM29LV080A-70)
1 TTL gate and 100 pF (MBM29LV080A-90/-12)
Input rise and fall times: 5 ns
Input pulse levels: 0.0 V to 3.0 V
Timing measurement reference level
Input: 1.5 V
Output: 1.5 V
Description
Test Setup
-70
(Note)
-90
(Note)
-12
(Note)
Unit
JEDEC
Standard
t
AVAV
t
RC
Read Cycle Time
Min.
70
90
120
ns
t
AVQV
t
ACC
Address to Output Delay
CE = V
IL
OE = V
IL
Max.
70
90
120
ns
t
ELQV
t
CE
Chip Enable to Output Delay
OE = V
IL
Max.
70
90
120
ns
t
GLQV
t
OE
Output Enable to Output Delay
Max.
30
35
50
ns
t
EHQZ
t
DF
Chip Enable to Output HIGH-Z
Max.
25
30
30
ns
t
GHQZ
t
DF
Output Enable to Output HIGH-Z
Max.
25
30
30
ns
t
AXQX
t
OH
Output Hold Time From Address,
CE or OE, Whichever Occurs First
Min.
0
0
0
ns
t
READY
RESET Pin Low to Read Mode
Max.
20
20
20
μ
s
C
L
3.3 V
Diodes = IN3064
or Equivalent
2.7 k
Device
Under
Test
IN3064
or Equivalent
6.2 k
Figure 4 Test Conditions
Notes: C
L
= 30 pF including jig capacitance (MBM29LV080A-70)
C
L
= 100 pF including jig capacitance (MBM29LV080A-90/-12)
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