VCC GND VALID
參數(shù)資料
型號: MC74HC595ADTR2
廠商: ON Semiconductor
文件頁數(shù): 10/12頁
文件大?。?/td> 0K
描述: IC SHIFT REGSTR 8BIT 3ST 16TSSOP
產(chǎn)品變化通告: Product Obsolescence 24/Jan/2011
標(biāo)準(zhǔn)包裝: 1
系列: 74HC
邏輯類型: 移位寄存器
輸出類型: 三態(tài)
元件數(shù): 1
每個元件的位元數(shù): 8
功能: 串行至并行
電源電壓: 2 V ~ 6 V
工作溫度: -55°C ~ 125°C
安裝類型: 表面貼裝
封裝/外殼: 16-TSSOP(0.173",4.40mm 寬)
供應(yīng)商設(shè)備封裝: 16-TSSOP
包裝: 剪切帶 (CT)
其它名稱: MC74HC595ADTROSCT
MC74HC595A
http://onsemi.com
7
SWITCHING WAVEFORMS
SERIAL
INPUT A
50%
SWITCH
CLOCK
VCC
GND
VALID
tsu
th
Figure 5.
SHIFT
CLOCK
OUTPUT
SQH
tr
tf
VCC
GND
90%
50%
10%
90%
50%
10%
tPLH
tPHL
tTLH
tTHL
tw
1/fmax
RESET
OUTPUT
SQH
SHIFT
CLOCK
tw
50%
VCC
GND
VCC
GND
tPHL
trec
tsu
50%
VCC
GND
LATCH
CLOCK
QA-QH
OUTPUTS
50%
tPLH
tPHL
tTLH
tTHL
90%
50%
10%
VCC
GND
VCC
GND
SHIFT
CLOCK
LATCH
CLOCK
Figure 3.
VCC
GND
tw
Figure 1.
Figure 2.
Figure 4.
Figure 6.
OUTPUT Q
50%
90%
10%
tPZL
tPLZ
tPZH
tPHZ
VCC
GND
HIGH
IMPEDANCE
VOL
VOH
HIGH
IMPEDANCE
OUTPUT
ENABLE
50%
TEST CIRCUITS
*Includes all probe and jig capacitance
CL*
TEST POINT
DEVICE
UNDER
TEST
OUTPUT
*Includes all probe and jig capacitance
CL*
TEST POINT
DEVICE
UNDER
TEST
OUTPUT
CONNECT TO VCC WHEN
TESTING tPLZ AND tPZL.
CONNECT TO GND WHEN
TESTING tPHZ AND tPZH.
1 k
W
Figure 7.
Figure 8.
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