- 您現(xiàn)在的位置：買賣IC網(wǎng) > PDF目錄45289 > MC9S08QE64CLH (FREESCALE SEMICONDUCTOR INC) 8-BIT, FLASH, 50.33 MHz, MICROCONTROLLER, PQFP64 PDF資料下載
參數(shù)資料
| 型號(hào)： | MC9S08QE64CLH |
| 廠商： | FREESCALE SEMICONDUCTOR INC |
| 元件分類： | 微控制器/微處理器 |
| 英文描述： | 8-BIT, FLASH, 50.33 MHz, MICROCONTROLLER, PQFP64 |
| 封裝： | 10 X 10 MM, 1.40 MM HEIGHT, 0.50 MM PITCH, MS-026BCD, LQFP-64 |
| 文件頁數(shù)： | 6/50頁 |
| 文件大?。?/td> | 1131K |
| 代理商： | MC9S08QE64CLH |
第1頁第2頁第3頁第4頁第5頁當(dāng)前第6頁第7頁第8頁第9頁第10頁第11頁第12頁第13頁第14頁第15頁第16頁第17頁第18頁第19頁第20頁第21頁第22頁第23頁第24頁第25頁第26頁第27頁第28頁第29頁第30頁第31頁第32頁第33頁第34頁第35頁第36頁第37頁第38頁第39頁第40頁第41頁第42頁第43頁第44頁第45頁第46頁第47頁第48頁第49頁第50頁
MC9S08QE128 Series Data Sheet, Rev. 7
Electrical Characteristics
Freescale Semiconductor
14
For most applications, PI/O << Pint and can be neglected. An approximate relationship between PD and TJ (if PI/O is neglected)
is:
PD = K ÷ (TJ + 273°C)
Eqn. 2
Solving Equation 1 and Equation 2 for K gives:
K = PD × (TA + 273°C) + θJA × (PD)2
Eqn. 3
where K is a constant pertaining to the particular part. K can be determined from equation 3 by measuring PD (at equilibrium)
for a known TA. Using this value of K, the values of PD and TJ can be obtained by solving Equation 1 and Equation 2 iteratively
for any value of TA.
3.5
ESD Protection and Latch-Up Immunity
Although damage from electrostatic discharge (ESD) is much less common on these devices than on early CMOS circuits,
normal handling precautions should be used to avoid exposure to static discharge. Qualification tests are performed to ensure
that these devices can withstand exposure to reasonable levels of static without suffering any permanent damage.
All ESD testing is in conformity with AEC-Q100 Stress Test Qualification for Automotive Grade Integrated Circuits. During
the device qualification ESD stresses were performed for the human body model (HBM), the machine model (MM) and the
charge device model (CDM).
A device is defined as a failure if after exposure to ESD pulses the device no longer meets the device specification. Complete
DC parametric and functional testing is performed per the applicable device specification at room temperature followed by hot
temperature, unless specified otherwise in the device specification.
Table 6. ESD and Latch-up Test Conditions
Model
Description
Symbol
Value
Unit
Human
Body
Series resistance
R1
1500
Ω
Storage capacitance
C
100
pF
Number of pulses per pin
—
3
Machine
Series resistance
R1
0
Ω
Storage capacitance
C
200
pF
Number of pulses per pin
—
3
Latch-up
Minimum input voltage limit
– 2.5
V
Maximum input voltage limit
7.5
V
Table 7. ESD and Latch-Up Protection Characteristics
No.
Rating1
1 Parameter is achieved by design characterization on a small sample size from typical devices
under typical conditions unless otherwise noted.
Symbol
Min
Max
Unit
1
Human body model (HBM)
VHBM
± 2000
—
V
2
Machine model (MM)
VMM
± 200
—
V
3
Charge device model (CDM)
VCDM
± 500
—
V
4
Latch-up current at TA = 85°CILAT
± 100
—
mA
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| MC9S08QE128CLD | 8-BIT, FLASH, 50.33 MHz, MICROCONTROLLER, PQFP44 |
| MC9S08QE64CFT | 8-BIT, FLASH, 50.33 MHz, MICROCONTROLLER, QCC48 |
| MC9S08QE128CLH | 8-BIT, FLASH, 50.33 MHz, MICROCONTROLLER, PQFP64 |
| MC9S08QE96CLD | 8-BIT, FLASH, 50.33 MHz, MICROCONTROLLER, PQFP44 |
| MC9S08QG8CFFER | 8-BIT, FLASH, 16 MHz, MICROCONTROLLER, QCC16 |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| MC9S08QE64CQD | 制造商:FREESCALE 制造商全稱:Freescale Semiconductor, Inc 功能描述:8-Bit HCS08 Central Processor Unit |
| MC9S08QE8 | 制造商:FREESCALE 制造商全稱:Freescale Semiconductor, Inc 功能描述:8-Bit HCS08 Central Processor Unit |
| MC9S08QE8_09 | 制造商:FREESCALE 制造商全稱:Freescale Semiconductor, Inc 功能描述:8-Bit HCS08 Central Processor Unit |
| MC9S08QE8_11 | 制造商:FREESCALE 制造商全稱:Freescale Semiconductor, Inc 功能描述:Up to 20 MHz CPU at 3.6 V to 1.8 V across temperature range of –40 °C to 85 °C |
| MC9S08QE8C16 | 制造商:FREESCALE 制造商全稱:Freescale Semiconductor, Inc 功能描述:8-Bit HCS08 Central Processor Unit |
發(fā)布緊急采購，3分鐘左右您將得到回復(fù)。