
Appendix A Electrical Characteristics
MC9S12E128 Data Sheet, Rev. 1.07
592
Freescale Semiconductor
A.6.4
ATD Accuracy — 5V Range
Table A-22 species the ATD conversion performance excluding any errors due to current injection, input
capacitance and source resistance.
A.6.5
ATD Accuracy — 3.3V Range
Table A-23 species the ATD conversion performance excluding any errors due to current injection, input
capacitance and source resistance.
Table A-22. 5V ATD Conversion Performance
Conditions are shown in
Table A-4 unless otherwise noted
VREF = VRH - VRL = 5.12V. Resulting to one 8 bit count = 20mV and one 10 bit count = 5mV
fATDCLK = 2.0MHz
Num
C
Rating
Symbol
Min
Typ
Max
Unit
1
P 10-Bit Resolution
LSB
—
5
—
mV
2
P 10-Bit Differential Nonlinearity
DNL
–1
—
1
Counts
3
P 10-Bit Integral Nonlinearity
INL
–2.0
—
2.0
Counts
4
P 10-Bit Absolute Error1
1 These values include quantization error which is inherently 1/2 count for any A/D converter.
AE
–2.5
—
2.5
Counts
5
C 10-Bit Absolute Error at fATDCLK= 4MHz
AE
—
±7.0
—
Counts
6
P 8-Bit Resolution
LSB
—
20
—
mV
7
P 8-Bit Differential Nonlinearity
DNL
–0.5
—
0.5
Counts
8
P 8-Bit Integral Nonlinearity
INL
–1.0
±0.5
1.0
Counts
9
AE
–1.5
±1.0
1.5
Counts
Table A-23. 3.3V ATD Conversion Performance
Conditions are shown in
Table A-4 unless otherwise noted
VREF = VRH - VRL = 3.328V. Resulting to one 8 bit count = 13mV and one 10 bit count = 3.25mV
fATDCLK = 2.0MHz
Num
C
Rating
Symbol
Min
Typ
Max
Unit
1
P 10-Bit Resolution
LSB
—
3.25
—
mV
2
P 10-Bit Differential Nonlinearity
DNL
–1.5
1.5
Counts
3
P 10-Bit Integral Nonlinearity
INL
–3.5
±1.5
3.5
Counts
4
P 10-Bit Absolute Error1
1 These values include the quantization error which is inherently 1/2 count for any A/D converter.
AE
–5
±2.5
5
Counts
5
C 10-Bit Absolute Error at fATDCLK= 4MHz
AE
—
±7.0
—
Counts
6
P 8-Bit Resolution
LSB
—
13
—
mV
7
P 8-Bit Differential Nonlinearity
DNL
–0.5
—
0.5
Counts
8
P 8-Bit Integral Nonlinearity
INL
–1.5
±1.0
1.5
Counts
9
AE
–2.0
±1.5
2.0
Counts