MCM69R736A
MCM69R818A
8
MOTOROLA FAST SRAM
AC OPERATING CONDITIONS AND CHARACTERISTICS
(0
°
C
≤
TA
≤
70
°
C, Unless Otherwise Noted)
Input Pulse Levels
Input Rise/Fall Time
Input Timing Measurement Reference Level
Output Timing Reference Level
0.25 to 1.25 V
1 V/ns (20% to 80%)
. . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . .
0.75 V
0.75 V
. . . . . . . . . . . . . . . . . . . . . . . . .
Clock Input Timing Reference Level
ZQ for 50
Impedance
R
θ
JA Under Test
Differential Cross–Point
. . . . . .
250
TBD
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
READ/WRITE CYCLE TIMING
(See Note 1)
MCM69R736A–5
MCM69R818A–5
MCM69R736A–6
MCM69R818A–6
MCM69R736A–7
MCM69R818A–7
MCM69R736A–8
MCM69R818A–8
Parameter
Symbol
Min
Max
Min
Max
Min
Max
Min
Max
Unit
Notes
Cycle Time
tKHKH
tKHKL
tKLKH
tKHQX1
tKHQV
tKHQX
tKHQZ
tGLQX
5
—
6
—
7
—
8
—
ns
Clock High Pulse Width
2
—
2.4
—
2.8
—
3.2
—
ns
Clock Low Pulse Width
2
—
2.4
—
2.8
—
3.2
—
ns
Clock High to Output Low–Z
1
—
1
—
1
—
1
—
ns
Clock High to Output Valid
—
2.5
—
3
—
3.5
—
4
ns
Clock High to Output Hold
0.5
—
0.5
—
0.5
—
0.5
—
ns
2
Clock High to Output High–Z
—
2.5
—
3
—
3.5
—
4
ns
2, 3
Output Enable Low to Output
Low–Z
0.5
—
0.5
—
0.5
—
0.5
—
ns
2, 3
Output Enable Low to Output
Valid
tGLQV
—
2.5
—
3
—
3.5
—
4
ns
Output Enable to Output Hold
tGHQX
tGHQZ
0.5
—
0.5
—
0.5
—
0.5
—
ns
Output Enable High to Output
High–Z
—
2.5
—
3
—
3.5
—
4
ns
2, 3
Setup Times:
Address
Data In
Chip Select
Write Enable
tAVKH
tDVKH
tSVKH
tWVKH
tKHAX
tKHDX
tKHSX
tKHWX
0.5
—
0.5
—
0.5
—
0.5
—
ns
Hold Times:
Address
Data In
Chip Select
Write Enable
1
—
1
—
1
—
1
—
ns
NOTES:
1. In no case may control input signals (e.g., SS) be operated with pulse widths less than the minimum clock input pulse width specifications
(e.g., tKHKL) or at frequencies that exceed the applied K clock frequency.
2. This parameter is sampled, and not 100% tested.
3. Measured at
±
200 mV from steady state.
The table of timing values shows either a minimum or
a maximum limit for each parameter. Input requirements
are specified from the external system point of view.
Thus, address setup time is shown as a minimum since
the system must supply at least that much time. On the
other hand, responses from the memory are specified
from the device point of view. Thus, the access time is
shown as a maximum since the device never provides
data later than that time.
TIMING LIMITS
DEVICE
UNDER
TEST
ZQ
50
50
0.75 V
VDDQ/2
Vref
250
Figure 1. Test Load