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參數(shù)資料
| 型號： | MG64P |
| 廠商： | OKI SEMICONDUCTOR CO., LTD. |
| 英文描述： | 0.25レm Embedded DRAM/ Customer Structured Arrays |
| 中文描述： | 0.25レ米嵌入式DRAM /客戶結(jié)構(gòu)數(shù)組 |
| 文件頁數(shù)： | 17/22頁 |
| 文件大?。?/td> | 267K |
| 代理商： | MG64P |
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MG63P/64P/65P
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15
Oki Semiconductor
More information on OKI’s floorplanning capabilities is available in Oki’s Application Note,
Using Oki’s
Floorplanner: Standalone Operation and Links to Synopsys
.
IEEE JTAG Boundary Scan Support
Boundary scan offers efficient board-level and chip-level testing capabilities. Benefits resulting from
incorporating boundary-scan logic into a design include:
Improved chip-level and board-level testing and failure diagnostic capabilities
Support for testing of components with limited probe access
Easy-to-maintain testability and system self-test capability with on-board software
Capability to fully isolate and test components on the scan path
Built-in test logic that can be activated and monitored
An optional Boundary Scan Identification (ID) Register
Gate Level
Netlist
(EDIF)
HDL Entry
Synthesis
Constraints
Constraints Met
No
Yes
Initial Floorplan
Invoke Export on
Floorplanner
Invoke Delay
Load
Back-Annotation Files
Constraints Met
No
Yes
Incremental
Optimization with
Physical Information
Constraints Met
No
Yes
Incremental
Floorplan
Invoke Import on
Floorplanner
To Simulation and P&R
DSPF/Oki RC/
PDEF (Synopsys)
Wire Load Model (Synopsys)
Net Capacitance (Synopsys
Script (Synopsys)
Delay
(SDF)
PDEF
(Synopsis)
Gate Level
Netlist
(EDIF)
Initial Synthesis
Timing Optimization
= In Synopsys DC/DA
= In Floorplanner
Figure 15. LSF System Design Flow
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