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參數(shù)資料
| 型號： | MIL-M-385101H |
| 廠商： | Electronic Theatre Controls, Inc. |
| 元件分類： | 運動控制電子 |
| 英文描述： | MICROCIRCUITS, LINEAR, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON |
| 中文描述： | 為電路，線性運算放大器，單片硅 |
| 文件頁數(shù)： | 14/43頁 |
| 文件大?。?/td> | 257K |
| 代理商： | MIL-M-385101H |
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MIL-M-38510/101J
TABLE II. Electrical test requirements.
MIL-PRF-38535
test requirements
Subgroups (see table III)
Class S
devices
Class B
devices
Interim electrical parameters
Final electrical test parameters 1/
Group A test requirements
Group C end point electrical
parameters
Additional electrical subgroups
For group C periodic inspections
Group D end point electrical
parameters
1
1
1,2,3,4
1,2,3,4
1,2,3,4,5,6,
7,8A,8B,12,
13A,13B
1,2,3, and
table IV delta
limits
Not applicable
1,2,3,4,5,6,7
1 and table IV
delta limits
8A,8B,12,
13A,13B
1
1,2,3
1/ PDA applies to subgroup 1.
4. VERIFICATION.
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as
modified in the device manufacturer’s Quality Management (QM) plan. The modification in the QM plan shall not affect the
form, fit, or function as function as described herein.
4.2 Screening. Screening shall be in accordance with MIL-PRF-38535, and shall be conducted on all devices prior to
qualification and quality conformance inspection. The following additional criteria shall apply:
a. The burn-in test duration, test condition, and test temperature, or approved alternatives shall be as specified in the
device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained
under document control by the device manufacturer's Technology Review Board (TRB) in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit
shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent
specified in test method 1015 of MIL-STD-883.
b. Interim and final electrical test parameters shall be as specified in table II, except interim electrical parameters test
prior to burn-in is optional at the discretion of the manufacturer.
c. Additional screening for space level product shall be as specified in MIL-PRF-38535.
14
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| MIL-M-385101J | MICROCIRCUITS, LINEAR, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON |
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| MIL-PRF-55318D | OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 0.01 Hz THROUGH 15.0 MHz, HERMETIC SEAL, SQUARE WAVE, CMOS |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| MIL-M-385101J | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:MICROCIRCUITS, LINEAR, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON |
| MIL-M-38514E | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:MICROCIRCUITS, DIGITAL, TTL, DATA SELECTORS/MULTIPLEXERS, MONOLITHIC SILICON |
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