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參數資料
| 型號： | MIL-M-385101H |
| 廠商： | Electronic Theatre Controls, Inc. |
| 元件分類： | 運動控制電子 |
| 英文描述： | MICROCIRCUITS, LINEAR, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON |
| 中文描述： | 為電路，線性運算放大器，單片硅 |
| 文件頁數： | 40/43頁 |
| 文件大小： | 257K |
| 代理商： | MIL-M-385101H |
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MIL-M-38510/101J
4.3 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-38535.
4.4 Technology Conformance inspection (TCI). Technology conformance inspection shall be in accordance with MIL-
PRF-38535 and herein for groups A, B, C, and inspections (see 4.4.1 through 4.4.4).
4.4.1 Group A inspection. Group A inspection shall be in accordance with table III of MIL-PRF-38535 and as follows:
a. Subgroups 9, 10, and 11 shall be omitted.
b. Tests shall be as specified in table II herein.
c. Subgroups 12 and 13 (for device type 07 only) shall be added to table III of MIL-PRF-38535 for class S only.
The class S sample size series for subgroup 12 shall be 5 and for subgroup 13 the class S sample size
series shall be 7.
4.4.2 Group B inspection. Group B inspection shall be in accordance with table II of MIL-PRF-38535.
4.4.3 Group C inspection. Group C inspection shall be in accordance with table IV of MIL-PRF-38535 and as follows:
a. End point electrical parameters shall be as specified in table II herein.
b. Subgroups shall be added to group C inspection and shall consist of subgroups 8, 12, and 13
respectively as specified in table III herein. The sample size series for subgroup 12 shall be 5, and
subgroup 13 shall be 7 for class B devices (see MIL-PRF-38535, Appendix D).
c.
The steady-state life test duration, test condition, and test temperature, or approved alternatives shall be as
specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall
be maintained under document control by the device manufacturer's Technology Review Board (TRB) in
accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request.
The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with
the intent specified in test method 1005 of MIL-STD-883.
4.4.4 Group D inspection. Group D inspection shall be in accordance with table V of MIL-PRF-38535. End point electrical
parameters shall be as specified in table II herein.
4.5 Methods of inspection. Methods of inspection shall be specified and as follows.
4.5.1 Voltage and current. All voltage values given, except the input offset voltage (or differential voltage) are referenced
to the external zero reference level of the supply voltage. Currents given are conventional current and positive when flowing
into the referenced terminal.
4.5.2 Burn-in and life test cooldown procedure. When devices are measured at +25
°
C following application of the steady
state life or burn-in condition, they shall be cooled to within 10
°
C of their power stable condition at room temperature prior to
removal of the bias.
40
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