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參數(shù)資料
| 型號： | MIL-PRF-19500 |
| 廠商： | 意法半導(dǎo)體 |
| 英文描述： | SEMICONDUCTOR DEVICE, TRANSISTOR, NPN, SILICON, LOW-POWER TYPES 2N2484, 2N2484UA, 2N2484UB, JAN, JANTX, JANTXV, JANS, JANHC, AND JANKC |
| 中文描述： | 半導(dǎo)體器件，晶體管，npn型，硅，低功耗類型2N2484，2N2484UA，2N2484UB 1月，JANTX，JANTXV，揚斯，JANHC和JANKC |
| 文件頁數(shù)： | 16/19頁 |
| 文件大?。?/td> | 113K |
| 代理商： | MIL-PRF-19500 |
MIL-PRF-19500/376E
16
TABLE III. Groups B and C delta measurements. 1/ 2/ 3/
Step
Inspection
MIL-STD-750
Conditions
Symbol
Limit
Unit
Method
1
Forward-current transfer
ratio
3076
V
CE
= 5 V dc; I
C
= 500
μ
A dc; pulsed see 4.5.1
4/
h
FE4
±
25 percent change from
initial recorded reading
2.
Collector to emitter
voltage (saturated)
3071
I
C
= 1.0 mA dc; I
B
= 100
μ
A dc
V
CE(sat)
4/ 5/
±
50 mV dc change from
previously measured value.
3.
Collector to emitter
cutoff current
3041
Bias condition C;
V
CB
= 45 V dc
I
CES
4/
100 percent of initial value
or 2 nA dc, whichever is
greater.
1/
The delta measurements for group B, table VIa (JANS) of MIL-PRF-19500 are as follows:
a.
Subgroup 4, see table III herein, step 2.
b.
Subgroup 5, see table III herein, steps 1 and 3.
The delta measurements for 4.4.2.2 herein (group B, JAN, JANTX, and JANTXV) are as follows: Steps 2
and 3 of table III shall be performed after each step in 4.4.2.2 herein.
The delta measurements for group C, table VII of MIL-PRF-19500 are as follows: Subgroup 6, see table III
herein, steps 1 and 3 for JANS, step 1 for JAN, JANTX, and JANTXV.
Devices which exceed the group A limits for this test shall not be accepted.
Applies to JANS level only.
2/
3/
4/
5/
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| MIL-PRF-19500/296 | 制造商:MICROSEMI 制造商全稱:Microsemi Corporation 功能描述:P-CHANNEL J-FET |
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