參數(shù)資料
型號: P1500SARP
英文描述: MCU CMOS 18 LD 4MHZ .5K FLASH, -40C to +85C, 18-SOIC 300mil, TUBE
中文描述: SIDAC的| 180V五(公報(bào))最大| 800mA的我(縣)|的DO - 214AA
文件頁數(shù): 78/161頁
文件大?。?/td> 986K
代理商: P1500SARP
GR 1089-Core
SIDACtor
Data Book
4 - 4
Teccor Electronics
(972) 580-7777
Table 4-1 Test Conditions
Notes:
1. When performing longitudinal tests, the test generator will have a dual output.
2. Connection appearances are shown in Figure 4-1.
Figure 4-1 Connection Appearances
Note:
Other outside plant leads associated with the unit should be grounded during test and the test repeated with
these leads terminated as in service. Leads that do not connected to outside plant should be terminated as is
appropriate for the operating mode(s) of the unit.
Test
Two-Wire Interface
Four-Wire Interface
A
1. Tip to Generator, Ring to ground.
2. Ring to Generator, Tip to ground.
3. Tip and Ring Surged Simultaneously
1. Each lead (T,R,T
1
,R
1
) tied to the Generator
with the other three leads grounded.
2. Tip and Ring to Generator, simultaneously,
T
1
and R
1
to ground.
3. T
1
and R
1
to Generator, simultaneously, Tip
and Ring to ground.
T, R, T
1
, R
1
to Generator simultaneously.
B
Tip and Ring Surged Simultaneously.
Connections to Test Generator
S1
S2
S3
S4
Condition A-1 of Table 4-1
Closed
Open
Open
Closed
Condition A-2 of Table 4-1
Open
Closed
Closed
Open
Condition A-3 of Table 4-1
Closed
Open
Closed
Open
T
E
R
M
T
E
R
M
Associated
Outside
Plant
Leads
Switch Unit
Under Test
Tip
S2
Ring
S4
S1
S3
Limiting
Resistance
(If Specified)
Test Generator
Voltage
Source
相關(guān)PDF資料
PDF描述
P1500SBRP MCU CMOS 18 LD 10MHZ .5K FLASH, -40C to +85C, 18-PDIP, TUBE
P1500SCRP MCU CMOS 18 LD LOW PWR, 0C to +70C, 18-SOIC 300mil, TUBE
P1602ABRP MCU CMOS 18 LD LOW PWR, -40C to +85C, 18-PDIP, TUBE
P1602AC MCU CMOS 18 LD LOW PWR, -40C to +85C, 18-SOIC 300mil, TUBE
P1602ACRP MCU CMOS 18 LD LOW PWR, 0C to +70C, 18-SOIC 300mil, T/R
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