參數(shù)資料
型號(hào): PK30N512VLQ100
廠商: Freescale Semiconductor
文件頁數(shù): 11/74頁
文件大?。?/td> 0K
描述: IC ARM CORTEX MCU 512K 144-LQFP
產(chǎn)品培訓(xùn)模塊: Kinetis® Cortex-M4 Microcontroller Family
標(biāo)準(zhǔn)包裝: 1
系列: Kinetis
核心處理器: ARM? Cortex?-M4
芯體尺寸: 32-位
速度: 100MHz
連通性: CAN,EBI/EMI,I²C,IrDA,SDHC,SPI,UART/USART
外圍設(shè)備: DMA,I²S,LCD,LVD,POR,PWM,WDT
輸入/輸出數(shù): 102
程序存儲(chǔ)器容量: 512KB(512K x 8)
程序存儲(chǔ)器類型: 閃存
RAM 容量: 128K x 8
電壓 - 電源 (Vcc/Vdd): 1.71 V ~ 3.6 V
數(shù)據(jù)轉(zhuǎn)換器: A/D 37x16b,D/A 2x12b
振蕩器型: 內(nèi)部
工作溫度: -40°C ~ 105°C
封裝/外殼: 144-LQFP
包裝: 托盤
Figure 2. Run mode supply current vs. core frequency
5.2.6 EMC radiated emissions operating behaviors
Table 7. EMC radiated emissions operating behaviors as measured on 144LQFP and
144MAPBGA packages
Symbol
Description
Frequency
band (MHz)
144LQFP
144MAPBGA
Unit
Notes
VRE1
Radiated emissions voltage, band 1
0.15–50
23
12
dBμV
1 , 2
VRE2
Radiated emissions voltage, band 2
50–150
27
24
dBμV
VRE3
Radiated emissions voltage, band 3
150–500
28
27
dBμV
VRE4
Radiated emissions voltage, band 4
500–1000
14
11
dBμV
VRE_IEC
IEC level
0.15–1000
K
1. Determined according to IEC Standard 61967-1, Integrated Circuits - Measurement of Electromagnetic Emissions, 150
kHz to 1 GHz Part 1: General Conditions and Definitions and IEC Standard 61967-2, Integrated Circuits - Measurement of
Electromagnetic Emissions, 150 kHz to 1 GHz Part 2: Measurement of Radiated Emissions—TEM Cell and Wideband
TEM Cell Method. Measurements were made while the microcontroller was running basic application code. The reported
emission level is the value of the maximum measured emission, rounded up to the next whole number, from among the
measured orientations in each frequency range.
General
K30 Sub-Family Data Sheet Data Sheet, Rev. 7, 02/2013.
Freescale Semiconductor, Inc.
19
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