參數(shù)資料
型號： PLDC20G10B-15WC
廠商： CYPRESS SEMICONDUCTOR CORP
元件分類： PLD
英文描述： CMOS Generic 24-Pin Reprogrammable Logic Device
中文描述： UV PLD, 15 ns, CDIP24
封裝： 0.300 INCH, WINDOWED, CERDIP-24
文件頁數(shù)： 5/14頁
文件大?。?/td> 393K
代理商： PLDC20G10B-15WC
USE ULTRA37000 FOR
ALL NEW DESIGNS
PLDC20G10B
PLDC20G10
Document #: 38-03010 Rev. *A
Page 5 of 14
Maximum Ratings
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature .................................–65
°
C to +150
°
C
Ambient Temperature with
Power Applied.............................................–55
°
C to +125
°
C
Supply Voltage to Ground Potential...............–0.5V to +7.0V
DC Voltage Applied to Outputs
in High Z State ...............................................–0.5V to +7.0V
DC Input Voltage............................................–3.0V to +7.0V
Output Current into Outputs (LOW) .............................16 mA
DC Programming Voltage
PLDC20G10B and CG7C323B–A...............................13.0V
PLDC20G10 and CG7C323–A....................................14.0V
Latch-Up Current.....................................................>200 mA
Static Discharge Voltage..............................................>500V
(per MIL-STD-883, Method 8015)
Operating Range
Range
Ambient Temperature
0
°
C to +75
°
C
–55
°
C to +125
°
C
–40
°
C to +85
°
C
V
CC
Commercial
Military
[3]
Industrial
5V
±
10%
5V
±
10%
5V
±
10%
Electrical Characteristics
Over the Operating Range (Unless Otherwise Noted)
[4]
Parameter
V
OH
Description
Test Conditions
I
OH
= –3.2 mA
I
OH
= –2 mA
I
OL
= 24 mA
I
OL
= 12 mA
Min.
2.4
Max.
Unit
V
Output HIGH Voltage
V
CC
= Min.,
V
IN
= V
IH
or V
IL
Com’l/Ind
Military
Com’l/Ind
Military
V
OL
Output LOW Voltage
V
CC
= Min.,
V
IN
= V
IH
or V
IL
Guaranteed Input Logical HIGH Voltage for All Inputs
[5]
Guaranteed Input Logical LOW Voltage for All Inputs
[5]
V
SS
≤
V
IN
≤
V
CC
0.5
V
V
IH
V
IL
I
IX
I
SC
I
CC
Input HIGH Level
Input LOW Level
Input Leakage Current
Output Short Circuit Current V
CC
= Max., V
OUT
= 0.5V
[6, 7]
Power Supply Current
2.0
V
V
μ
A
mA
mA
mA
mA
mA
μ
A
0.8
+10
–90
70
55
100
80
100
–10
0
≤
V
IN
≤
V
CC
V
CC
= Max.,
I
OUT
= 0 mA
Unprogrammed Device
Com’l/Ind–15, –20
Com’l/Ind–25, –35
Military–20, –25
Military–30, –40
I
OZ
Output Leakage Current
V
CC
= Max., V
SS
≤
V
OUT
≤
V
CC
–100
Capacitance
[7]
Parameter
Description
Test Conditions
T
A
= 25
°
C, f = 1 MHz
V
IN
= 2.0V, V
CC
= 5.0V
Max.
10
10
Unit
pF
pF
C
IN
C
OUT
Notes:
3. T
is the “instant on” case temperature.
4. See the last page of this specification for Group A subgroup testing information.
5. These are absolute values with respect to device ground. All overshoots due to system or tester noise are included.
6. Not more than one output should be tested at a time. Duration of the short circuit should not be more than one second. V
OUT
= 0.5V has been chosen to avoid
test problems caused by tester ground degradation.
7. Tested initially and after any design or process changes that may affect these parameters.
Input Capacitance
Output Capacitance
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