RM3183
PRODUCT SPECIFICATION
2
Functional Description
The RM3183 contains two discrete ARINC 429 receiver
channels. Each channel contains three main sections: a
resistor-diode input network, a window comparator, and a
logic output buffer stage. The first stage provides overvolt-
age protection and biases the signal using voltage dividers
and current sources which are internally connected to the
+V
L
logic supply. This configuration provides excellent
input common mode rejection and a stable reference voltage
for the window comparators. Because the threshold for
switching is determined by this circuitry,
recommended for the +V
L
supply. The test inputs will set the
outputs to a predetermined state for built-in test capability.
±
5% tolerance is
The ARINC inputs must be forced to 0V when using the test
inputs. If the test inputs are not used, they should be
grounded.
The window comparator stage generates two serial data
streams, one having logic 1 states corresponding to ARINC
“High” states (OUTA), and the other having logic 1 states
corresponding to ARINC “Low” states (OUTB). An ARINC
“Null” state at the inputs forces both outputs to logic 0.
Thus, the ARINC clock signal is recovered by applying a
NOR function to OUTA and OUTB.
The output stage generates a TTL compatible logic output
capable of driving several gate inputs.
Pin Assignments
Absolute Maximum Ratings
Parameter
Supply Voltage
Min.
Max.
+20
–20
+7
+125
+150
±
50
Units
VDC
VDC
VDC
°
C
°
C
V
+V
–V
+V
S
S
L
Operating Temperature Range
Storage Temperature Range
Input Voltage Range
Output Short Circuit Duration
Internal Power Dissipation
Lead Soldering Temperature (60 seconds)
-55
-65
Not protected
900
+300
mW
°
C
20
2
3
4
5
6
7
8
9
10
-V
S
TestA
Ceramic Dip
Top View
Cap2B
In2B
Out2B
In2A
Cap2A
Out2A
+V
L
NC
11
12
13
14
15
16
17
18
19
TestB
+V
S
Out1B
NC
GND
Out1A
In1B
Cap1B
In1A
Cap1A
65-3183-02
65-3183-03
4
5
6
7
8
In2B
Out2B
In2A
Cap2A
Out2A
14
15
16
17
18
GND
Out1A
In1B
Cap1B
In1A
C
1
T
2
-
S
T
C
1
2
3
N
O
+
S
N
+
L
1
1
1
1
9
LCC
Top View