參數(shù)資料
型號(hào): SAK-TC1767-256F133HL
廠商: INFINEON TECHNOLOGIES AG
元件分類(lèi): 微控制器/微處理器
英文描述: 32-BIT, FLASH, 133 MHz, RISC MICROCONTROLLER, PQFP176
封裝: 0.50 MM PITCH, GREEN, PLASTIC, LQFP-176
文件頁(yè)數(shù): 78/126頁(yè)
文件大?。?/td> 826K
代理商: SAK-TC1767-256F133HL
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TC1767
Introduction
Data Sheet
51
V1.3, 2009-09
Invalidation of the Data Cache (maintaining write-back data) can be done
concurrently with the same SFR.
256 KB additional Overlay RAM on Emulation Device.
The 256 KB Trace memory of the Emulation Device can optionally be used for
Overlay also.
A dedicated trigger SFR with 32 independent status bits is provided to centrally post
requests from application code to the host computer.
The host is notified automatically when the trigger SFR is updated by the TriCore or
PCP. No polling via a system bus is required.
2.5.4
Tool Interfaces
Three options exist for the communication channel between Tools (e.g. Debugger,
Calibration Tool) and TC1767:
Two wire DAP (Device Access Port) protocol for long connections or noisy
environments.
Four (or five) wire JTAG (IEEE 1149.1) for standardized manufacturing tests.
CAN (plus software linked into the application code) for low bandwidth deeply
embedded purposes.
DAP and JTAG are clocked by the tool.
Bit clock up to 40 MHz for JTAG, up to 80 MHz for DAP.
Hot attach (i.e. physical disconnect/reconnect of the host connection without reset of
the TC1767) for all interfaces.
Infineon standard DAS (Device Access Server) implementation for seamless,
transparent tool access over any supported interface.
Lock mechanism to prevent unauthorized tool access to critical application code.
2.5.5
Self-Test Support
Some manufacturing tests can be invoked by the application (e.g. after power-on) if
needed:
Hardware-accelerated checksum calculation (e.g. for Flash content).
2.5.6
FAR Support
To efficiently locate and identify faults after integration of a TC1767 into a system special
functions are available:
Boundary Scan (IEEE 1149.1) via JTAG and DAP.
SSCM (Single Scan Chain Mode
1)) for structural scan testing of the chip itself.
1) This function requires access to some device pins (e.g. TESTMODE) in addition to those needed for OCDS.
相關(guān)PDF資料
PDF描述
SAK-TC1782-320F180HL 32-BIT, FLASH, 180 MHz, RISC MICROCONTROLLER, PQFP176
SAK-XC164CS-32F40F 16-BIT, FLASH, 40 MHz, RISC MICROCONTROLLER, PQFP100
SAK-XC164CS-32F20F 16-BIT, FLASH, 20 MHz, RISC MICROCONTROLLER, PQFP100
SAK-XC2267M-104F80LAA 32-BIT, FLASH, 80 MHz, RISC MICROCONTROLLER, PQFP100
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相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
SAK-TC1767-256F133HL AD 功能描述:32位微控制器 - MCU 32 BIT FLASH RoHS:否 制造商:Texas Instruments 核心:C28x 處理器系列:TMS320F28x 數(shù)據(jù)總線寬度:32 bit 最大時(shí)鐘頻率:90 MHz 程序存儲(chǔ)器大小:64 KB 數(shù)據(jù) RAM 大小:26 KB 片上 ADC:Yes 工作電源電壓:2.97 V to 3.63 V 工作溫度范圍:- 40 C to + 105 C 封裝 / 箱體:LQFP-80 安裝風(fēng)格:SMD/SMT
SAK-TC1767-256F133HLAD 制造商:Infineon Technologies AG 功能描述:
SAK-TC1767-256F80HL 制造商:INFINEON 制造商全稱:Infineon Technologies AG 功能描述:32-Bit Single-Chip Microcontroller
SAK-TC1767-256F80HL AD 功能描述:32位微控制器 - MCU 32 BIT FLASH RoHS:否 制造商:Texas Instruments 核心:C28x 處理器系列:TMS320F28x 數(shù)據(jù)總線寬度:32 bit 最大時(shí)鐘頻率:90 MHz 程序存儲(chǔ)器大小:64 KB 數(shù)據(jù) RAM 大小:26 KB 片上 ADC:Yes 工作電源電壓:2.97 V to 3.63 V 工作溫度范圍:- 40 C to + 105 C 封裝 / 箱體:LQFP-80 安裝風(fēng)格:SMD/SMT
SAK-TC1767-256F80HLAD 制造商:Rochester Electronics LLC 功能描述: 制造商:Infineon Technologies AG 功能描述: