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參數(shù)資料
| 型號： | SI5013-EVB |
| 廠商： | Silicon Laboratories Inc |
| 文件頁數(shù)： | 13/26頁 |
| 文件大?。?/td> | 0K |
| 描述： | BOARD EVALUATION FOR SI5013 |
| 標(biāo)準(zhǔn)包裝： | 1 |
| 主要目的： | 計(jì)時(shí)，時(shí)鐘和數(shù)據(jù)恢復(fù)（CDR） |
| 已用 IC / 零件： | SI5013 |
| 已供物品： | 板 |
| 其它名稱： | 336-1123 |
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Si5013
20
Rev. 1.6
5
6
REFCLK+
REFCLK–
ISee Table 2
Differential Reference Clock (Optional).
When present, the reference clock sets the center
operating frequency of the DSPLL for clock and
data recovery. Tie REFCLK+ to VDD and REFCLK–
to GND to operate without an external reference
clock.
See Table 7 on page 12 for typical reference clock
frequencies.
7
LOL
OLVTTL
Loss-of-Lock.
This output is driven low when the recovered clock
frequency deviates from the reference clock by the
amount specified in Table 4 on page 9. If no exter-
nal reference is supplied, this signal will be active
when the internal PLL is no longer locked to the
incoming data.
8
LTR
ILVTTL
Lock-to-Reference.
When this pin is low, the DSPLL disregards the data
inputs. If an external reference is supplied, the out-
put clock locks to the supplied reference. If no
external reference is used, the DSPLL locks the
control loop until LTR is released.
Note: This input has a weak internal pullup.
9
LOS
OLVTTL
Loss-of-Signal.
This output pin is driven low when the input signal is
below the threshold set via LOS_LVL. (LOS opera-
tion is guaranteed only when ac coupling is used on
the DIN inputs.)
10
DSQLCH
LVTTL
Data Squelch.
When driven high, this pin forces the data present
on DOUT+ to zero and DOUT– to one. For normal
operation, this pin should be low. DSQLCH may be
used during LOS/LOL conditions to prevent random
data from being presented to the system.
Note: This input has a weak internal pulldown.
11,14,18,21,
25
VDD
3.3 V
Supply Voltage.
Nominally 3.3 V.
12
13
DIN+
DIN–
ISee Table 2
Differential Data Input.
Clock and data are recovered from the differential
signal present on these pins. AC coupling is recom-
mended.
15
GND
Production Test Input.
This pin is used during production testing and must
be tied to GND for normal operation.
Table 8. Si5013 Pin Descriptions (Continued)
Pin #
Pin Name
I/O
Signal Level
Description
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