參數(shù)資料
型號: SN54ABTH182646AHV
廠商: Texas Instruments, Inc.
英文描述: SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS
中文描述: 掃描測試設(shè)備與18位收發(fā)器和寄存器
文件頁數(shù): 12/37頁
文件大小: 559K
代理商: SN54ABTH182646AHV
SN54ABTH18646A, SN54ABTH182646A, SN74ABTH18646A, SN74ABTH182646A
SCAN TEST DEVICES WITH
18-BIT TRANSCEIVERS AND REGISTERS
SCBS166D – AUGUST 1993 – REVISED JULY 1996
12
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
boundary-control register
The boundary-control register (BCR) is three bits long. The BCR is used in the context of the boundary-run test
(RUNT) instruction to implement additional test operations not included in the basic SCOPE
instruction set.
Such operations include PRPG, PSA, and binary count up (COUNT). Table 4 shows the test operations that
are decoded by the BCR.
During Capture-DR, the contents of the BCR are not changed. At power up or in Test-Logic-Reset, the BCR is
reset to the binary value 010, which selects the PSA test operation. The BCR order of scan is shown in
Figure 4.
Bit 0
(LSB)
TDO
TDI
Bit 1
Bit 2
(MSB)
Figure 4. Boundary-Control Register Order of Scan
bypass register
The bypass register is a 1-bit scan path that can be selected to shorten the length of the system scan path,
reducing the number of bits per test pattern that must be applied to complete a test operation. During
Capture-DR, the bypass register captures a logic 0. The bypass register order of scan is shown in
Figure 5.
Bit 0
TDO
TDI
Figure 5. Bypass Register Order of Scan
相關(guān)PDF資料
PDF描述
SN54ABTH18646AHV SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS
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SN54ABTH1826520A Scan Test Devices With 18 Bit Universal Bus Transceivers and Registers( 掃描檢測裝置,帶18位總線收發(fā)器和寄存器)
SN74ABTH1826520A Scan Test Devices With 18 Bit Universal Bus Transceivers And Registers( 掃描檢測裝置帶18位總線收發(fā)器和寄存器)
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