參數(shù)資料
型號: SN54ABTH182646AHV
廠商: Texas Instruments, Inc.
英文描述: SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS
中文描述: 掃描測試設(shè)備與18位收發(fā)器和寄存器
文件頁數(shù): 5/37頁
文件大?。?/td> 559K
代理商: SN54ABTH182646AHV
SN54ABTH18646A, SN54ABTH182646A, SN74ABTH18646A, SN74ABTH182646A
SCAN TEST DEVICES WITH
18-BIT TRANSCEIVERS AND REGISTERS
SCBS166D – AUGUST 1993 – REVISED JULY 1996
5
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
functional block diagram
Boundary-Scan Register
One of Nine Channels
1OE
1DIR
1CLKBA
1SBA
1CLKAB
1SAB
1A1
1B1
1D
C1
1D
C1
One of Nine Channels
2OE
2DIR
2CLKBA
2SBA
2CLKAB
2SAB
2A1
2B1
1D
C1
1D
C1
Boundary-Control
Register
Instruction
Register
TDI
TMS
TCK
TDO
TAP
Controller
VCC
24
VCC
56
Bypass Register
Identification
Register
62
53
55
54
59
60
63
21
30
27
28
23
22
10
26
51
40
58
VCC
VCC
Pin numbers shown are for the PM package.
相關(guān)PDF資料
PDF描述
SN54ABTH18646AHV SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS
SN54ABTH182646A Scan Test Devices With 18 Bit Universal Bus Transceivers( 掃描檢測裝置,帶18位收發(fā)器和寄存器)
SN54ABTH1826520A Scan Test Devices With 18 Bit Universal Bus Transceivers and Registers( 掃描檢測裝置,帶18位總線收發(fā)器和寄存器)
SN74ABTH1826520A Scan Test Devices With 18 Bit Universal Bus Transceivers And Registers( 掃描檢測裝置帶18位總線收發(fā)器和寄存器)
SN54ABTH18652A Scan Test Devices With 18 Bit Universal Bus Transceivers and Registers( 掃描檢測裝置,帶18位總線收發(fā)器和寄存器)
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