參數(shù)資料
型號(hào): SN74ABT18502PM
廠商: TEXAS INSTRUMENTS INC
元件分類: 總線收發(fā)器
英文描述: ABT SERIES, DUAL 9-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, PQFP64
封裝: GREEN, PLASTIC, LQFP-64
文件頁(yè)數(shù): 1/32頁(yè)
文件大?。?/td> 578K
代理商: SN74ABT18502PM
SN74ABT18502
SCAN TEST DEVICE
WITH 18-BIT REGISTERED BUS TRANSCEIVER
SCBS753 – FEBRUARY 2002
1
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
D Member of the Texas Instruments
Widebus
Family
D UBT Transceiver Combines D-Type
Latches and D-Type Flip-Flops for
Operation in Transparent, Latched, or
Clocked Mode
D Compatible With IEEE Std 1149.1-1990
(JTAG) Test Access Port (TAP) and
Boundary-Scan Architecture
D Includes D-Type Flip-Flops and Control
Circuitry to Provide Multiplexed
Transmission of Stored and Real-Time Data
D Two Boundary-Scan Cells (BSCs) Per I/O
for Greater Flexibility
D SCOPE Instruction Set
– IEEE Std 1149.1-1990 Required
Instructions, Optional INTEST, and
P1149.1A CLAMP and HIGHZ
– Parallel Signature Analysis (PSA) at
Inputs With Masking Option
– Pseudorandom Pattern Generation
(PRPG) From Outputs
– Sample Inputs/Toggle Outputs (TOPSIP)
– Binary Count From Outputs
– Device Identification
– Even-Parity Opcodes
18 19
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
20
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
21 22 23 24
63 62 61 60 59
64
58
56 55 54
57
25 26 27 28 29
53 52
17
51 50 49
30 31 32
1OEAB
GND
1CLKAB
TDO
1A2
1A1
1LEAB
V
1LEBA
1OEBA
1B1
1B2
TMS
1CLKBA
GND
1B3
2A9
GND
2LEAB
2CLKAB
2A7
2A8
2OEAB
TDI
2CLKBA
2LEBA
2OEBA
2B9
V
TCK
GND
2B8
1A3
1A4
1A5
GND
1A6
1A7
1A8
1A9
VCC
2A1
2A2
2A3
GND
2A4
2A5
2A6
1B4
1B5
1B6
GND
1B7
1B8
1B9
VCC
2B1
2B2
2B3
2B4
GND
2B5
2B6
2B7
CC
PM PACKAGE
(TOP VIEW)
Copyright
2002, Texas Instruments Incorporated
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SCOPE, UBT, and Widebus are trademarks of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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