參數(shù)資料
型號: SN74ABT8373
廠商: Texas Instruments, Inc.
英文描述: Scan Test Devices With Octal D-Type Latches(掃描測試裝置(帶八D鎖存器))
中文描述: 掃描測試設(shè)備與八路D類鎖存器(掃描測試裝置(帶八?鎖存器))
文件頁數(shù): 19/19頁
文件大?。?/td> 391K
代理商: SN74ABT8373
IMPORTANT NOTICE
Texas Instruments (TI) reserves the right to make changes to its products or to discontinue any semiconductor
product or service without notice, and advises its customers to obtain the latest version of relevant information
to verify, before placing orders, that the information being relied on is current.
TI warrants performance of its semiconductor products and related software to the specifications applicable at
the time of sale in accordance with TI’s standard warranty. Testing and other quality control techniques are
utilized to the extent TI deems necessary to support this warranty. Specific testing of all parameters of each
device is not necessarily performed, except those mandated by government requirements.
Certain applications using semiconductor products may involve potential risks of death, personal injury, or
severe property or environmental damage (“Critical Applications”).
TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, INTENDED, AUTHORIZED, OR WARRANTED
TO BE SUITABLE FOR USE IN LIFE-SUPPORT APPLICATIONS, DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICATIONS.
Inclusion of TI products in such applications is understood to be fully at the risk of the customer. Use of TI
products in such applications requires the written approval of an appropriate TI officer. Questions concerning
potential risk applications should be directed to TI through a local SC sales office.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards should be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance, customer product design, software performance, or
infringement of patents or services described herein. Nor does TI warrant or represent that any license, either
express or implied, is granted under any patent right, copyright, mask work right, or other intellectual property
right of TI covering or relating to any combination, machine, or process in which such semiconductor products
or services might be or are used.
Copyright
1996, Texas Instruments Incorporated
相關(guān)PDF資料
PDF描述
SN54ABT8374 Scan Test Devices With Octal D-Type Edge-Triggered Flip-Flops(掃描測試裝置(帶八D邊沿觸發(fā)器))
SN74ABT8374 Scan Test Devices With Octal D-Type Edge-Triggered Flip-Flops(掃描測試裝置(帶八D邊沿觸發(fā)器))
SN54ABT845 Octal Bus Interface D-Type Latches With 3-State Outputs(八總線接口D鎖存器(三態(tài)輸出))
SN74ABT845 Octal Bus Interface D-Type Latches With 3-State Outputs(八總線接口D觸發(fā)器(三態(tài)輸出))
SN54ABT8543FK SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS
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SN74ABT841ADBR 功能描述:閉鎖 10bit Bus D RoHS:否 制造商:Micrel 電路數(shù)量:1 邏輯類型:CMOS 邏輯系列:TTL 極性:Non-Inverting 輸出線路數(shù)量:9 高電平輸出電流: 低電平輸出電流: 傳播延遲時(shí)間: 電源電壓-最大:12 V 電源電壓-最小:5 V 最大工作溫度:+ 85 C 最小工作溫度:- 40 C 封裝 / 箱體:SOIC-16 封裝:Reel
SN74ABT841ADBRE4 功能描述:閉鎖 10bit Bus D RoHS:否 制造商:Micrel 電路數(shù)量:1 邏輯類型:CMOS 邏輯系列:TTL 極性:Non-Inverting 輸出線路數(shù)量:9 高電平輸出電流: 低電平輸出電流: 傳播延遲時(shí)間: 電源電壓-最大:12 V 電源電壓-最小:5 V 最大工作溫度:+ 85 C 最小工作溫度:- 40 C 封裝 / 箱體:SOIC-16 封裝:Reel
SN74ABT841ADBRG4 功能描述:閉鎖 10B Bus-Interface D-Type RoHS:否 制造商:Micrel 電路數(shù)量:1 邏輯類型:CMOS 邏輯系列:TTL 極性:Non-Inverting 輸出線路數(shù)量:9 高電平輸出電流: 低電平輸出電流: 傳播延遲時(shí)間: 電源電壓-最大:12 V 電源電壓-最小:5 V 最大工作溫度:+ 85 C 最小工作溫度:- 40 C 封裝 / 箱體:SOIC-16 封裝:Reel
SN74ABT841ADW 功能描述:閉鎖 10bit Bus D RoHS:否 制造商:Micrel 電路數(shù)量:1 邏輯類型:CMOS 邏輯系列:TTL 極性:Non-Inverting 輸出線路數(shù)量:9 高電平輸出電流: 低電平輸出電流: 傳播延遲時(shí)間: 電源電壓-最大:12 V 電源電壓-最小:5 V 最大工作溫度:+ 85 C 最小工作溫度:- 40 C 封裝 / 箱體:SOIC-16 封裝:Reel
SN74ABT841ADWG4 功能描述:閉鎖 10B Bus-Interface D-Type RoHS:否 制造商:Micrel 電路數(shù)量:1 邏輯類型:CMOS 邏輯系列:TTL 極性:Non-Inverting 輸出線路數(shù)量:9 高電平輸出電流: 低電平輸出電流: 傳播延遲時(shí)間: 電源電壓-最大:12 V 電源電壓-最小:5 V 最大工作溫度:+ 85 C 最小工作溫度:- 40 C 封裝 / 箱體:SOIC-16 封裝:Reel