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參數(shù)資料
| 型號： | SPT7866SCR |
| 廠商： | FAIRCHILD SEMICONDUCTOR CORP |
| 元件分類： | ADC |
| 英文描述： | 1-CH 10-BIT PROPRIETARY METHOD ADC, PARALLEL ACCESS, PDSO28 |
| 封裝： | SSOP-28 |
| 文件頁數(shù)： | 3/8頁 |
| 文件大小： | 59K |
| 代理商： | SPT7866SCR |
3
11/20/01
SPT7866
ELECTRICAL SPECIFICATIONS
TA=TMIN to TMAX, VDD=+5.0 V, S=60 MSPS, VREFH=3.0 V, VREFL=2.0 V, OVDD=3.0 V, unless otherwise specified.
TEST
SPT7866
PARAMETERS
CONDITIONS
LEVEL
MIN
TYP
MAX
UNITS
Power Supply Requirements
VDD Voltage (Analog Supply)
IV
4.75
5.0
5.25
V
OVDD Voltage (Output Supply)
IV
2.7
3.0/5.0
5.25
V
VDD Current
VI
98
mA
OVDD Current
VI
10
mA
Power Dissipation
External Voltage Reference
VI
482
513
mW
Internal Voltage Reference
VI
480
512
mW
Sleep Mode Power Dissipation
External Voltage Reference
VI
45
47
mW
Internal Voltage Reference
VI
55
57
mW
Power Supply Rejection Ratio (PSRR)
V
51
dB
Internal References
Common Mode Voltage Reference (VCM) IO = –1 A
VI
2.4
2.5
2.6
V
Common Mode Voltage Tempco
V
100
ppm/°C
Output Impedance (VCM)
V
1.4
k
Reference Low Output Voltage (VREFL)
(EXT/INT) = 0
VI
1.95
2.0
2.05
V
Reference High Output Voltage (VREFH)
(EXT/INT) = 0
VI
2.95
3.0
3.05
V
External References
Reference Low Input Voltage Range
(EXT/INT) = 1
IV
1.7
2.0
2.3
V
Reference High Input Voltage Range
(EXT/INT) = 1
IV
2.7
3.0
3.3
V
Digital Outputs
Output Voltage High
IO = –2 mA
VI
85% OVDD
90% OVDD
OVDD
V
Output Voltage Low
IO = 2 mA
VI
0.2
0.4
V
Digital Inputs
Input High Voltage
VI
80% VDD
V
Input Low Voltage
VI
20% VDD
V
Input High Current
VI
±100
A
Input Low Current
VI
±100
A
Clock Inputs
Clock Inputs High Voltage
VI
2
5
V
Clock Inputs Low Voltage
VI
0.4
V
Clock Inputs High Current
VI
±115
A
Clock Inputs Low Current
VI
±115
A
TEST LEVEL CODES
All electrical characteristics are subject to the
following conditions:
All parameters having min/max specifications are
guaranteed. The Test Level column indicates the
specific device testing actually performed during
production and Quality Assurance inspection. Any
blank section in the data column indicates that the
specification is not tested at the specified
condition.
TEST PROCEDURE
100% production tested at the specified temperature.
100% production tested at TA = +25 °C, and sample tested
at the specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design and
characterization data.
Parameter is a typical value for information purposes only.
100% production tested at TA = +25 °C. Parameter is
guaranteed over specified temperature range.
TEST LEVEL
I
II
III
IV
V
VI
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