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參數(shù)資料
| 型號： | SPT7870SIQ |
| 廠商： | SIGNAL PROCESSING TECHNOLOGIES |
| 元件分類： | ADC |
| 英文描述： | 1-CH 10-BIT PROPRIETARY METHOD ADC, PARALLEL ACCESS, CQFP44 |
| 封裝： | CERQUAD-44 |
| 文件頁數(shù)： | 3/8頁 |
| 文件大?。?/td> | 67K |
| 代理商： | SPT7870SIQ |
SPT
3
9/8/98
SPT7870
ELECTRICAL SPECIFICATIONS
TA=+25 °C, VCC=+5.0 V, VEE=-5.2 V, VIN=±1.0 V, fClock=80 MHz, 50% clock duty cycle, unless otherwise specified.
TEST
PARAMETERS
CONDITIONS
LEVEL
MIN
TYP
MAX
UNITS
Dynamic Performance
Signal-to-Noise & Distortion (SINAD)
fIN = 10 MHz
I
51
54
dB
fIN = 25 MHz
I
51
53
dB
fIN = 25 MHz
fClock = 100 MHz
V
50
dB
fIN = 50 MHz
I
46.5
48
dB
fIN = 50 MHz
fClock = 100 MHz
V
47
dB
Spurious Free Dynamic Range
fIN = 10 MHz
V
65
dB FS
fIN = 25 MHz
V
62
dB FS
fIN = 50 MHz
V
52
dB FS
Two-Tone Intermodulation
Dist. Rejection2
V
-65
dBc
Differential Phase
V
0.5
Degree
Differential Gain
V
1
%
Power Supply Requirements
+VCC Supply Voltage
IV
4.75
5.0
5.25
V
- VEE Supply Voltage
IV
-4.95
-5.2
-5.45
V
+VCC Supply Current
VI
127
151
mA
- VEE Supply Current
VI
202
240
mA
Power Dissipation
VI
1.7
2.0
W
Power Supply Rejection Ratio
IV
30
dB
Digital Inputs
LINV, MINV
V
CMOS/TTL
Logic
Clock Inputs
Logic 1 Voltage
VI
-1.1
V
Logic 0 Voltage
VI
-1.5
V
Maximum Input Current Low
VI
-100
+100
A
Maximum Input Current HIgh
VI
-100
+100
A
Pulse Width Low (tpwl)
IV
4.0
250
ns
Pulse Width High (tpwh)
IV
4.0
250
ns
Rise/Fall Time
20% to 80%
IV
1.5
ns
Digital Outputs
Logic 1 Voltage (ECL)
50
to -2 V, DGND=0.0 V
VI
-1.1
-0.9
V
Logic 0 Voltage (ECL)
50
to -2 V, DGND=0.0 V
VI
-1.7
-1.5
V
Logic 1 Voltage (PECL)
50
to +3 V, DGND=+5.0 V
IV
3.9
4.1
V
Logic 0 Voltage (PECL)
50
to +3 V, DGND=+5.0 V
IV
3.3
3.5
V
trise
10% to 90%
V
2.0
ns
tfall
10% to 90%
V
2.0
ns
12048 pt FFT using distortion harmonics 2 through 10.
2Measured as a second order (f1-f2) intermodulation product from a two-tone test, with each input tone at 0 dBm.
TEST LEVEL CODES
All electrical characteristics are subject to the
following conditions:
All parameters having min/max specifications
are guaranteed. The Test Level column indi-
cates the specific device testing actually per-
formed during production and Quality Assur-
ance inspection. Any blank section in the data
column indicates that the specification is not
tested at the specified condition.
TEST PROCEDURE
100% production tested at the specified temperature.
100% production tested at TA=25 °C, and sample
tested at the specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design
and characterization data.
Parameter is a typical value for information purposes
only.
100% production tested at TA = 25 °C. Parameter is
guaranteed over specified temperature range.
TEST LEVEL
I
II
III
IV
V
VI
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| SPT7910SCJ | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:12-BIT, 10 MSPS, ECL, A/D CONVERTER |
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