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Lucent Technologies Inc.
23
Data Sheet
February 1999
Codec Chip Set
T7531A/T7536 16-Channel Programmable
Chip Set Functional Description
(continued)
Self-Test and Board-Test Routines
(continued)
Tone Detection
In tone detection mode, the TX part of the channel can
be used to detect signal energy from the line at a given
frequency up to 4 kHz. This routine performs discrete
Fourier transform (DFT) to capture and analyze the
reflected tone. The routine does not employ the trans-
mit bandpass filters. The number of frames to sample
the reflected tone must be defined. The number of
frames that DFT is run must be a power of 2 and should
be complete cycles of tone value.
dc Generation
This routine generates a dc signal (value defined by
user) in the RX path.
Variance Computation
The variance routine computes the variance of small
noise signals from the TX path around the computed
mean level. This routine employs the transmit band-
pass filters for out-of-band noise reduction.
Peak Detection
This routine examines the incoming TX signal and
saves the maximum and minimum signal values.
Handling Precautions
Although protection circuitry has been designed into
this device, proper precautions should be taken to
avoid exposure to electrostatic discharge (ESD) during
handling and mounting. Lucent Technologies employs
a human-body model (HBM) and a charged-device
model (CDM) for ESD-susceptibility testing and protec-
tion design evaluation. ESD voltage thresholds are
dependent on the circuit parameters used to define the
model. No industry-wide standard has been adopted
for the CDM. A standard HBM (resistance = 1500
,
capacitance = 100 pF) is widely accepted and can be
used for comparison. The HBM ESD threshold pre-
sented here was obtained by using these circuit
parameters:
HBM ESD Threshold
Device
T7531A
T7536
Voltage (V)
>1000
>1000
Absolute Maximum Ratings
Stresses in excess of the absolute maximum ratings can cause permanent damage to the device. These are abso-
lute stress ratings only. Functional operation of the device is not implied at these or any other conditions in excess
of those given in the operational section of the data sheet. Exposure to absolute maximum ratings for extended
periods can adversely affect device reliability.
Parameter
Symbol
T
A
T
J
R
Θ
JC
T
stg
V
DD
V
SS
P
D
Min
–40
–40
—
–55
4.75
–0.25
—
Max
85
125
35
150
5.25
5.25
1
Unit
°
C
°
C
°
C/W
°
C
V
V
W
Ambient Operating Temperature
Operating Junction Temperature
Thermal Resistance, Junction to Case
Storage Temperature Range
Power Supply Voltage
Voltage on Any Pin with Respect to Ground
Package Power Dissipation