參數(shù)資料
型號(hào): TA1276AN
廠商: Toshiba Corporation
英文描述: TOSHIBA BIPOLAR LINEAR INTEGRATED CIRCUIT SILICON MONOLITHIC
中文描述: 東芝雙極線性集成電路硅單片
文件頁(yè)數(shù): 24/86頁(yè)
文件大?。?/td> 1049K
代理商: TA1276AN
TA1276AN
2002-03-29
24
CHARACTERISTIC
SYMBOL
TEST
CIR-
CUIT
TEST CONDITION
MIN
TYP.
MAX
UNIT
G
MAXL
11
14
17
G
MINL
11
8
5
G
MAXH
11
14
17
Sharpness Control Range
G
MINH
(Note V
12
)
9
6
3
G
CENL
7
10
13
Sharpness Control Center Gain
G
CENH
7
10
13
G
YL
11
8
5
YNR Characteristic
G
YH
(Note V
13
)
9
6
4
dB
T
SL1
100
120
140
T
SRTL
40
60
80
T
SH1
160
180
200
SRT Response to 2T Pulse Input
T
SRTH
(Note V
14
)
20
30
45
ns
F
VL
When normal mode
7
9
11
VSM Peak Frequency
F
VH
When double scan mode
12.5
16
19.5
MHz
G
VL00
11
13
15
G
VL01
7.5
6
4.5
G
VL10
11
9
8
G
VL11
35
29
G
VH00
11
13
15
G
VH01
7.5
6
5
G
VH10
11
9
7
VSM Gain
G
VH11
(Note V
15
)
32
26
G
VRL
4
3
2
G
VLL
4
3
2
G
VRH
4
3
2
VSM Parabolic Modulating Gain
G
VLH
(Note V
16
)
4
3
2
dB
Threshold Voltage of VSM Muting
V
SR36
Pin 32, Pin 36
0.65
0.75
0.85
V
T
VML1
0
50
100
T
VML2
0
50
100
T
VML3
0
50
100
T
VML4
0
50
100
T
VMH1
0
50
100
T
VMH2
0
50
100
T
VMH3
0
50
100
Response Time for VSM High Speed
Muting
T
VMH4
(Note V
17
)
0
50
100
T
Y2RD
When through
26
36
46
T
Y2RL
When normal mode
200
220
240
Between Y2 Input and R Output Delay
Time
T
Y2RH
When double scan mode
85
100
115
ns
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